SAA-XC866-1FRA INFINEON [Infineon Technologies AG], SAA-XC866-1FRA Datasheet - Page 100
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SAA-XC866-1FRA
Manufacturer Part Number
SAA-XC866-1FRA
Description
8-Bit Single-Chip Microcontroller
Manufacturer
INFINEON [Infineon Technologies AG]
Datasheet
1.SAA-XC866-1FRA.pdf
(114 pages)
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Table 36
Parameter
Overload current
coupling factor for
digital I/O pins
Switched
capacitance at the
reference voltage
input
Switched
capacitance at the
analog voltage
inputs
Input resistance of
the reference input
Input resistance of
the selected analog
channel
1)
2)
3)
4)
5)
Data Sheet
Not subject to production test, verified by design/characterization.
TUE is tested at V
This represents an equivalent switched capacitance. This capacitance is not switched to the reference voltage
at once. Instead of this, smaller capacitances are successively switched to the reference voltage.
The sampling capacity of the conversion C-Network is pre-charged to V
the C-Network. Because of the parasitic elements, the voltage measured at ANx is lower than V
An overload current (
current adds to the respective pin’s leakage current (
overload current and is defined by the overload coupling factor
is inverse compared to the polarity of the overload current that produces it. The total current through a pin is
|
I
TOT
| = |
I
OZ1
| + (|
ADC Characteristics (Operating Conditions apply;
I
AREF
OV
| ×
I
OV
= 5.0 V, V
Symbol
K
C
C
R
R
K
) through a pin injects a certain error current (
AREF
AIN
OVD
AREFSW
AINSW
OV
). The additional error current may distort the input voltage on analog inputs.
CC –
CC –
CC –
CC
CC
AGND
min.
–
–
–
= 0 V , V
Limit Values
DDP
typ .
–
–
10
5
1
1
97
= 5.0 V.
I
OZ
max.
5.0 x
10
1.0 x
10
20
7
2
1.5
). The amount of error current depends on the
-3
-2
K
OV
. The polarity of the injected error current
Unit
–
–
pF
pF
kΩ
kΩ
I
AREF
INJ
) into the adjacent pins. This error
/2 before connecting the input to
Electrical Parameters
Test Conditions/
Remarks
I
I
1)4)
1)5)
1)
1)
OV
OV
V
> 0
< 0
DDP
1)3)
1)3)
SAA-XC866
= 5V Range)
V1.5, 2010-09
AREF
/2.
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