AT83C5122_08 ATMEL [ATMEL Corporation], AT83C5122_08 Datasheet - Page 184
AT83C5122_08
Manufacturer Part Number
AT83C5122_08
Description
C51 Microcontroller with USB and Smart Card Reader Interfaces
Manufacturer
ATMEL [ATMEL Corporation]
Datasheet
1.AT83C5122_08.pdf
(208 pages)
- Current page: 184 of 208
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Electrical Characteristics
Absolute Maximum Ratings
DC Parameters
T
184
Symbol
V
V
V
V
V
V
V
I
I
I
R
R
CIO
DV
DI
V
V
t
IL
LI
TL
rise,
Ambiant Temperature Under Bias ......................-25 C to 85 C
Storage Temperature .................................... -65 C to + 150 C
Voltage on V
Voltage on Any Pin to V
Power Dissipation 1 W
A
IL
IH
IH1
OL
OH
OL1
OH1
PFDP
PFDM
MEDIUM
WEAK
CC
= -40 to +85 C; V
CC
t
fall
AT83R5122, AT8xC5122/23
Parameter
Input Low Voltage
Input High Voltage except XTAL1, RST
Input High Voltage, XTAL1, RST
Output Low Voltage: P0, ALE, PSEN
Output High Voltage: P0, ALE, PSEN
Output Low Voltage: P2, P3, P4, P5, P1.2, P1.6,
P1.7
Output High Voltage: P2, P3, P4, P5, P1.2, P1.6,
P1.7
Logical 0 Input Current ports 2 to 5 and P1.2, P1.6,
P1.7, if Weak pull-up enabled
Input Leakage Current
Logical 1 to O transistion Current, Port 51
configuration
Medium Pullup Resistor
Weak Pullup Resistor
Capacitance of I/O Buffer
Digital Supply Voltage
Digital Supply Output Current (DVcc pin)
Power Fail High Level Threshold
Power Fail Low Level Threshold
V
DD
CC
rise and fall time
to V
SS
SS
......................................-0.5 V to + 6.0V
SS
= 0 V, F
........................-0.5 V to V
CK_CPU
= 0 to 24 MHz , V
CC
+ 0.5 V
0.2 V
CC
0.7 V
0.9 V
0.9 V
Min
-0.5
1 s
= 3.0V to 5.5V
CC
2,5
3
CC
CC
CC
+ 0.9
Note:
Typ
100
3.4
2.8
2.6
10
Stresses at or above those listed under “Absolute
Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only and functional
operation of the device at these or any other condi-
tions above those indicated in the operational
sections of this specification is not implied. Exposure
to absolute maximum rating conditions may affect
device reliability.
Power Dissipation value is based on the maximum
allowable die temperature and the thermal resistance
of the package.
0.2 V
V
V
CC
CC
Max
0.45
0.45
600
-50
3.6
650
10
10
CC
10
3
+ 0.5
+ 0.5
- 0.1
second
Unit
mA
k
k
pF
V
V
V
V
V
V
V
V
V
V
A
A
A
Test Conditions
I
I
I
I
Vin = 0.45 V
0.45 V < V
V
Fc = 1MHz
T
C
C
F
OL
OH
OL
OH
A
IN
CK_CPU
L
L
= 25 C
= 470 nF
= 100 nF
= 1.6 mA
= 0.8 mA
= 10 μA
= -10 μA
= 2 V
4202F–SCR–07/2008
= 24 MHz
IN
< V
CC
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