CAT25010 CATALYST [Catalyst Semiconductor], CAT25010 Datasheet - Page 2

• Manufacturer Part Number: CAT25010
• Description: 1K/2K/4K SPI Serial CMOS EEPROM
• Manufacturer: CATALYST [Catalyst Semiconductor]

Temperature Under Bias ................. –55 C to +125 C
Storage Temperature ....................... –65 C to +150 C
Voltage on any Pin with
V
Package Power Dissipation
Lead Soldering Temperature (10 secs) ............ 300 C
Output Short Circuit Current
V
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V
(5) V
(6) Maximum standby current (I
Doc. No. 1006, Rev. L
CC
CC
N
T
V
I
LTH
voltage on output pins is V
I
I
I
I
I
V
V
V
V
V
V
Respect to V
Capability (Ta = 25 C) ................................... 1.0W
DR
CC1
CC2
SB
LI
LO
ZAP
END
with Respect to V
IL
IL
IH
OL1
OH1
OL2
OH2
= +1.8V to +6.0V, unless otherwise specified.
(6)
min and V
(5)
(3)
(3)(4)
(5)
(3)
(3)
IH
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Power Supply Current
(Operating Write)
Power Supply Current
(Operating Read)
Power Supply Current
(Standby)
Input Leakage Current
Output Leakage Current
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
max are reference values only and are not tested.
SS
(1)
.................. –2.0V to +V
SS ................................
CC
SB
+0.5V, which may overshoot to V
(2)
) = 10 A for the Automotive and Extended Automotive temperature range.
........................ 100 mA
1,000,000
–2.0V to +7.0V
2000
100
100
CC
V
V
V
CC
CC
+2.0V
CC
-1
x 0.7
- 0.8
-0.2
CC
+2.0V for periods of less than 20 ns.
2
Cycles/Byte
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation
of the device at these or any other conditions outside of
those listed in the operational sections of this specifica-
tion is not implied. Exposure to any absolute maximum
rating for extended periods may affect device perfor-
mance and reliability.
Years
Volts
mA
V
V
CC
CC
0.4
0.2
5
3
1
2
3
+ 0.5
x 0.3
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
CC
mA
mA
V
V
V
V
V
V
A
A
A
+1V.
V
SO=open; CS=Vss
V
F
CS = V
V
V
V
CS = 0V
1.8V V
I
I
OL
OH
CLK
CC
CC
IN
IN
OUT
2.7V V
I
I
= 150 A
OL
OH
= V
= V
= -100 A
= 5V @ 5MHz
= 5.5V
= 5MHz
= 0V to V
= 3.0mA
CC
SS
SS
= -1.6mA
CC
<2.7V
or V
or V
CC
<5.5V
CC
CC
CC
,