ADN2860-EVAL AD [Analog Devices], ADN2860-EVAL Datasheet - Page 4

• Manufacturer Part Number: ADN2860-EVAL
• Description: 3-Channel Digital Potentiometer with Nonvolatile Memory
• Manufacturer: AD [Analog Devices]

ADN2860
Parameter
POWER SUPPLIES
1
2
3
4
5
6
7
Typical represents average readings at 25°C, V
Resistor position nonlinearity error R-INL is the deviation from an ideal value measured between the maximum resistance and the minimum resistance wiper
INL and DNL are measured at V
Resistor Terminals A, B, and W have no limitations on polarity with respect to each other.
Guaranteed by design and not subject to production test.
Bandwidth, noise, and settling time are dependent on the terminal resistance value chosen. The lowest R value results in the fastest settling time and highest
P
positions. R-DNL measures the relative step change from ideal between successive tap positions.
bandwidth. The highest R value results in the minimum overall power consumption.
DISS
Input Leakage Current (Excluding WP
Input Capacitance
Single-Supply Power Range
Dual-Supply Power Range
Positive Supply Current
Negative Supply Current
EEMEM Data Storing Mode Current
EEMEM Data Restoring Mode Current
Power Dissipation
Power Supply Sensitivity
and A0)
is calculated from (I
SDA
SCL
7
5
DD
× V
P
DD
W
5
t
). CMOS logic level inputs result in minimum power dissipation.
1
with the RDAC configured as a potentiometer divider similar to a voltage output D/A converter. V
S
t
2
DD
= 5 V.
t
3
Symbol
I
C
V
V
I
I
I
I
P
P
I
DD
SS
DD_STORE
DD_RESTORE
DISS
SS
I
DD
DD
/V
t
8
SS
t
8
Figure 2. I
Rev. A | Page 4 of 20
t
t
9
Conditions
V
V
V
V
2.5 V, V
V
V
V
∆V
4
2
IH
IN
SS
IH
IH
IH
IH
C Timing Diagram
DD
= V
= 0 V or V
= V
= V
= V
= V
= 0 V
= 5 V ± 10%
DD
DD
DD
DD
DD
SS
or V
or V
or V
or V
= 5 V or V
= −2.5 V
t
5
IL
DD
IL
IL
IL
= GND, V
= GND, V
= GND
= GND
IL
= GND
S
SS
DD
t
7
= 0 V
=
t
6
Min
2.7
±2.25
A
Typ
5
5
−5
35
2.5
25
0.01
= V
DD
1
and V
P
t
10
B
Max
±1
5.5
±2.75
15
−15
75
0.025
= 0 V.
Unit
µA
pF
V
V
µA
µA
mA
mA
µW
%/%