acfm-7102 Avago Technologies, acfm-7102 Datasheet - Page 4

• Manufacturer Part Number: acfm-7102
• Description: Pcs/cellular/s-gps Quintplexer
• Manufacturer: Avago Technologies

Characterization
A test circuit similar to that shown in Figure 1 was used
to measure device performance. This circuit is designed
to interface with Air Coplanar (ACP), Ground-Signal-
Ground (GSG) RF probes of the type commonly used to
test semiconductor wafers.
The test circuit is a 17 x 14 mm PCB with a well-grounded
pad to which the device under test (DUT) is solder-
mounted.
Figure 1. ACP Probe Test Circuit.
4
Absolute Maximum Ratings
Maximum Recommended Operating Conditions
Parameter
Storage temperature
Maximum RF Input Power to Tx Ports
Parameter
Operating temperature, Tc
Operating temperature, Tc
Notes:
1) Operation in excess of any one of these conditions may result in permanent damage to the device.
2) The device will function over the recommended range without degradation in reliability or permanent change in performance, but is not
3) T
guaranteed to meet electrical specifications.
C
is defined as case temperature, the temperature of the underside of the quintplexer where it makes contact with the circuit board.
[3]
[3]
, Tx Power ≤ 9 dBm
, Tx Power ≤ 30 dBm
[1]
[2]
Unit
°C
dBm
Unit
°C
°C
Short lengths of 50-ohm microstripline connect the DUT
to ACP probe patterns on the board.
A test circuit with an ACFM-7102 mounted in place is
shown in Figure 2. S-parameters are measured using a
vector network analyzer and calibrated ACP probe set.
Phase data for s-parameters measured with ACP probe
circuits are adjusted to place the reference plane at the
edge of the quintplexer package.
Figure 2. Test Circuit with ACFM-7102 Quintplexer.
Value
–65 to +5
+33
Value
–40 to +00
–40 to +85