saa5647hl NXP Semiconductors, saa5647hl Datasheet - Page 101

• Manufacturer Part Number: saa5647hl
• Description: Saa56xx Enhanced Tv Microcontrollers With On-screen Display Osd
• Manufacturer: NXP Semiconductors

Philips Semiconductors
29 QUALITY AND RELIABILITY
This device will meet Philips Semiconductors General Quality Specification for Integrated Circuits “SNW-FQ-611D” . The
principal requirements are shown in Tables 43 to 45.
29.1
Table 43 Acceptance tests per lot
Note
1. ppm = fraction of defective devices, in parts per million.
29.2
Table 44 Reliability tests (by process family)
Note
1. FPM = fraction of devices failing at test condition, in Failures Per Million.
Table 45 Reliability tests (by device type)
2004 Sep 03
Mechanical
Electrical
High temperature operating life
Humidity life
Temperature cycling performance
ESD and latch-up
Enhanced TV microcontrollers with
On-Screen Display (OSD)
Lot acceptance
Reliability Performance
TEST
TEST
TEST
cumulative target: <80 ppm
cumulative target: <100 ppm
168 hours at T
temperature, humidity, bias 1000 hours,
85 C, 85% RH (or equivalent test)
ESD Human body model 100 pF, 1.5 k
ESD Machine model 200 pF, 0
latch-up
65 to 150 C
CONDITIONS
CONDITIONS
j
= 150 C
101
REQUIREMENTS
<500 FPM
<1000 FPM
<2000 FPM
2000 V
200 V
100 mA, 1.5
(1)
REQUIREMENTS
REQUIREMENTS
V
DD(max)
Product specification
SAA56xx
(1)