gs8662dt11bgd-500i GSI Technology, gs8662dt11bgd-500i Datasheet - Page 16

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gs8662dt11bgd-500i

Manufacturer Part Number
gs8662dt11bgd-500i
Description
72mb Sigmaquad-ii+tm Burst Of 4 Sram
Manufacturer
GSI Technology
Datasheet
Capacitance
(T
AC Test Conditions
Rev: 1.00 5/2011
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Note:
This parameter is sample tested.
Note:
Test conditions as specified with output loading as shown unless otherwise noted.
V
Note:
Input Undershoot/Overshoot voltage must be –2 V > Vi < V
A
SS
= 25
Undershoot Measurement and Timing
– 1.0 V
50%
V
V
SS
IH
o
C, f = 1 MH
Output Capacitance
Clock Capacitance
Input Capacitance
Parameter
Z
, V
DQ
DD
20% tKHKH
= 1.8 V)
Output reference level
Input reference level
Max. input slew rate
Input high level
Input low level
Parameter
VT = 0.75 V
Symbol
C
C
C
OUT
CLK
IN
AC Test Load Diagram
DDn
16/34
50
+2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
Test conditions
V
V
DD
V
V
OUT
IN
IN
+ 1.0 V
Overshoot Measurement and Timing
GS8662DT20/38BD-550/500/450/400/350
= 0 V
= 0 V
RQ = 250 (HSTL I/O)
V
50%
V
= 0 V
V
DD
REF
IL
GS8662DT06/11BD-500/450/400/350
= 0.75 V
20% tKHKH
Conditions
Typ.
V
1.25 V
0.25 V
2 V/ns
0.75 V
4
6
5
DDQ
/2
© 2011, GSI Technology
Max.
5
7
6
Unit
pF
pF
pF

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