adate302-02 Analog Devices, Inc., adate302-02 Datasheet - Page 18

• Manufacturer Part Number: adate302-02
• Description: 500 Mhz Dual Integrated Dcl With Differential Drive/receive, Level Setting Dacs, And Per Pin Pmu
• Manufacturer: Analog Devices, Inc.

ADATE302-02
ABSOLUTE MAXIMUM RATINGS
Table 14.
Parameter
Supply Voltages
Input Voltages
DUTx I/O Pin Current
Temperature
1
2
3
4
R
clamp modes).
DATAxP, DATAxN, RCVxP, RCVxN, under source R = 0 Ω.
DATAxP to DATAxN, RCVxP, RCVxN.
R
condition. ADATE302-02 must current limit and survive continuous short
circuit.
L
L
Positive Supply Voltage (V
Positive V
Negative Supply Voltage (V
Supply Voltage Difference (V
Reference Ground (DUTGND to GND)
AGND to DGND
VPLUS Supply Voltage (V
Input Common-Mode Voltage
Short-Circuit Voltage
High Speed Input Voltage
High Speed Differential Input Voltage
VREF
DCL Maximum Short-Circuit Current
Operating Temperature, Junction
Storage Temperature Range
= 0 Ω, V
= 0 Ω, V
DUTx
DUTx
CC
continuous short-circuit condition (VH, VL, VT, high-Z, VCOM,
= −3 V to +8 V; DCL current limit. Continuous short-circuit
Supply Voltage (V
1
PLUS
2
DD
SS
to GND)
to GND)
DD
to GND)
CC
to V
to GND)
SS
)
4
3
Rating
−0.5 V to +11.0 V
−0.5 V to +4.0 V
−6.25 V to +0.5 V
−1.0 V to +16.5 V
−0.5 V to +0.5 V
−0.5 V to +0.5 V
−0.5 V to +17.5 V
V
−3.0 V to +8.0 V
0 to V
0 to V
−0.5 V to +5.5 V
±140 mA
125°C
−65°C to +150°C
SS
to V
CC
CC
DD
Rev. 0 | Page 18 of 52
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
Table 15. Thermal Resistance
Package Type
84-Ball CSP_BGA
EXPLANATION OF TEST LEVELS
D
S
P
P
C
C
ESD CAUTION
F
T
B
Definition
Design verification simulation
100% production tested
Functionally checked during production test
Characterized on tester
Characterized on bench
θ
31.1
JA
θ
0.51
JC
Unit
°C/W