a3pn010 Actel Corporation, a3pn010 Datasheet - Page 42

• Manufacturer Part Number: a3pn010
• Description: Proasic 3 Nano Flash Fpgas
• Manufacturer: Actel Corporation

Radiation-Tolerant ProASIC3 FPGAs
Table 2-27 • Schmitt Trigger Input Hysteresis, Hysteresis Voltage Value (typical) for Schmitt Mode Input
Table 2-28 • Duration of Short Circuit Event before Failure
Table 2-29 • I/O Input Rise Time, Fall Time, and Related I/O Reliability
2 -3 0
Input Buffer Configuration
3.3 V LVTTL/LVCMOS/PCI/PCI-X (Schmitt trigger mode)
2.5 V LVCMOS (Schmitt trigger mode)
1.8 V LVCMOS (Schmitt trigger mode)
1.5 V LVCMOS (Schmitt trigger mode)
1.2 V LVCMOS (Schmitt trigger mode)
Temperature
–40°C
0°C
25°C
70°C
85°C
100°C
110°C
125°C
Input Buffer
LVTTL/LVCMOS
LVDS/B-LVDS/
M-LVDS/LVPECL
*
The maximum input rise/fall time is related to the noise induced in the input buffer trace. If the noise is low,
the rise time and fall time of input buffers can be increased beyond the maximum value. The longer the
rise/fall times, the more susceptible the input signal is to the board noise. Actel recommends signal integrity
evaluation/characterization of the system to ensure that there is no excessive noise coupling into input signals.
The length of time an I/O can withstand I
reliability data below is based on a 3.3 V, 12 mA I/O setting, which is the worst case for this type of
analysis.
For example, at 110°C, the short current condition would have to be sustained for more than three
months to cause a reliability concern. The I/O design does not contain any short circuit protection,
but such protection would only be needed in extremely prolonged stress conditions.
Buffers Applicable
Input Rise/Fall Time (min.)
No requirement
No requirement
A d v a n c e v 0. 1
OSH
Input Rise/Fall Time (max.)
/I
OSL
events depends on the junction temperature. The
10 ns *
10 ns *
Time before Failure
> 20 years
> 20 years
> 20 years
6 months
3 months
1 month
5 years
2 years
Hysteresis Value (typical)
20 years (110°C)
10 years (100°C)
240 mV
140 mV
40 mV
80 mV
60 mV
Reliability