s-8261aajmd Seiko Instruments Inc., s-8261aajmd Datasheet - Page 12

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s-8261aajmd

Manufacturer Part Number
s-8261aajmd
Description
Battery Protection Ic For Single-cell Pack
Manufacturer
Seiko Instruments Inc.
Datasheet

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*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
12
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = −40 to +85°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = −40 to +85°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
tested in production.
tested in production.
(5)
(6)
S-8261ABI, S-8261ABL, S-8261ABT
S-8261ABY, S-8261ABZ, S-8261ACA
Item
Item
*1
*1
Symbol
t
t
t
t
t
Symbol
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
CU
DL
lOV1
lOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
Seiko Instruments Inc.
Table 12
Table 13
Condition
Condition
0.96
Min.
0.96
0.89
0.61
Min.
220
150
115
220
150
7.2
1.8
0.7
1.2
7.2
0.7
29
20
80
5
5
Typ.
2.24
2.24
Typ.
1.12
1.12
320
320
144
320
144
320
1.2
1.2
1.2
1.2
36
36
9
9
9
9
Max.
Max.
1.35
1.91
380
540
173
380
245
540
1.4
2.7
2.0
3.8
1.4
43
11
61
15
11
15
2
Unit
Unit
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
µs
µs
µs
µs
s
s
s
s
Condition
condition
Rev.4.4
Test
Test
10
10
10
10
10
10
10
10
10
10
10
10
9
9
9
9
9
9
9
9
Circuit
circuit
Test
Test
_00
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5

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