s-8261aajmd Seiko Instruments Inc., s-8261aajmd Datasheet - Page 12

• Manufacturer Part Number: s-8261aajmd
• Description: Battery Protection Ic For Single-cell Pack
• Manufacturer: Seiko Instruments Inc.

*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
12
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = −40 to +85°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = −40 to +85°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
S-8261 Series
tested in production.
tested in production.
(5)
(6)
S-8261ABI, S-8261ABL, S-8261ABT
S-8261ABY, S-8261ABZ, S-8261ACA
Item
Item
*1
*1
Symbol
t
t
t
t
t
Symbol
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
CU
DL
lOV1
lOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
Seiko Instruments Inc.
Table 12
Table 13
Condition
Condition




















0.96
Min.
0.96
0.89
0.61
Min.
220
150
115
220
150
7.2
1.8
0.7
1.2
7.2
0.7
29
20
80
5
5
Typ.
2.24
2.24
Typ.
1.12
1.12
320
320
144
320
144
320
1.2
1.2
1.2
1.2
36
36
9
9
9
9
Max.
Max.
1.35
1.91
380
540
173
380
245
540
1.4
2.7
2.0
3.8
1.4
43
11
61
15
11
15
2
Unit
Unit
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
µs
µs
µs
µs
s
s
s
s
Condition
condition
Rev.4.4
Test
Test
10
10
10
10
10
10
10
10
10
10
10
10
9
9
9
9
9
9
9
9
Circuit
circuit
Test
Test
_00
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5