s-8261aajmd Seiko Instruments Inc., s-8261aajmd Datasheet - Page 11

• Manufacturer Part Number: s-8261aajmd
• Description: Battery Protection Ic For Single-cell Pack
• Manufacturer: Seiko Instruments Inc.

*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
*1. Since products are not screened at high and low temperatures, the specification for this temperature range is guaranteed by design, not
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = −40 to +85°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = 25°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
DELAY TIME (Ta = −40 to +85°C)
Overcharge detection delay time
Overdischarge detection delay time
Overcurrent 1 detection delay time
Overcurrent 2 detection delay time
Load short-circuiting detection delay time
Rev.4.4
tested in production.
tested in production.
(3)
(4)
S-8261AAT
S-8261AAU, S-8261AAX, S-8261ABA
_00
Item
Item
*1
*1
Symbol
t
t
t
t
t
Symbol
t
t
t
t
t
t
t
t
t
t
t
t
t
t
t
CU
DL
lOV1
lOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
CU
DL
lOV1
lOV2
SHORT
BATTERY PROTECTION IC FOR SINGLE-CELL PACK
Seiko Instruments Inc.
Table 10
Table 11
Condition
Condition




















Min.
Min.
220
150
115
220
150
3.7
7.2
2.5
3.7
7.2
1.8
2.5
1.2
29
14
20
10
80
5
5
Typ.
Typ.
2.24
2.24
320
320
144
320
144
320
4.6
4.6
4.6
4.6
36
18
36
18
9
9
9
9
Max.
Max.
380
540
173
380
245
540
5.5
7.8
5.5
2.7
7.8
3.8
43
22
11
61
31
15
11
15
Unit
Unit
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
ms
µs
µs
µs
µs
S-8261 Series
s
s
s
s
Condition
Condition
Test
Test
10
10
10
10
10
10
10
10
10
10
10
10
9
9
9
9
9
9
9
9
Circuit
Circuit
Test
Test
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
5
11