m29f002b-70p6tr STMicroelectronics, m29f002b-70p6tr Datasheet
m29f002b-70p6tr
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m29f002b-70p6tr Summary of contents
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... PROGRAM/ERASE CYCLES per BLOCK 20 YEARS DATA RETENTION – Defectivity below 1 ppm/year ELECTRONIC SIGNATURE – Manufacturer Code: 20h – Top Device Code M29F002BT: B0h – Top Device Code M29F002BNT: B0h – Bottom Device Code M29F002BB: 34h – Bottom Device Code M29F002BNB: 34h ® ECOPACK ...
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... A1 A0 DQ0 17 SUMMARY DESCRIPTION The M29F002B Mbit (256Kb x8) non-volatile memory that can be read, erased and repro- grammed. These operations can be performed us- ing a single 5V supply. On power-up the memory defaults to its Read mode where it can be read in the same way as a ROM or EPROM. The M29F002B is fully backward compatible with the M29F002 ...
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... Reset/Block Temporary Unprotect (RP). The Re- set/Block Temporary Unprotect pin can be used to apply a Hardware Reset to the memory or to tem- porarily unprotect all blocks that have been pro- tected. On the M29F002BNT the pin is not connected internally and this feature is not avail- able. A Hardware Reset is achieved by holding Reset/ ...
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... M29F002BT, M29F002BB, M29F002BNT, M29F002BNB Table 2. Absolute Maximum Ratings Symbol Ambient Operating Temperature (Temperature Range Option 1) T Ambient Operating Temperature (Temperature Range Option 6) A Ambient Operating Temperature (Temperature Range Option 3) T Temperature Under Bias BIAS T Storage Temperature STG (2) Input or Output Voltage V IO ...
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... The Device Code can be read using a Bus Read operation with address bits may be set to either V Device Code for the M29F002BT is B0h, the M29F002BNT is B0h and the M29F002BB is 34h. The Block Protection Status of each block can be read using a Bus Read operation with ...
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... M29F002BT, M29F002BB, M29F002BNT, M29F002BNB See the section on the Status Register for more details. After the program operation has completed the memory will return to the Read mode, unless an error has occurred. When an error occurs the memory will continue to output the Status Regis- ter ...
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... Erase Resume. After the Erase Resume command the suspended Erase operation resumes, read the Status Register until the Program/ Erase Controller completes and the memory returns to Read Mode. M29F002BT, M29F002BB, M29F002BNT, M29F002BNB mediately when the Erase Resume Command is is- sued. It will not be possible to select any further blocks for erasure after the Erase Resume ...
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... M29F002BT, M29F002BB, M29F002BNT, M29F002BNB Table 7. Program, Erase Times and Program, Erase Endurance Cycles ( 70°C, –40 to 85°C or –40 to 125°C) A Parameter Chip Erase (All bits in the memory set to ‘0’) Chip Erase Block Erase (64 Kbytes) Program Chip Program Program/Erase Cycles (per Block) Note ° ...
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... Erase operation. Figure 5, Data Toggle Flowchart, gives an exam- ple of how to use the Data Toggle Bit. M29F002BT, M29F002BB, M29F002BNT, M29F002BNB Error Bit (DQ5). The Error Bit can be used to identify errors detected by the Program/Erase Controller. The Error Bit is set to ’1’ when a Pro- gram, Block Erase or Chip Erase operation fails to write the correct data to the memory ...
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... M29F002BT, M29F002BB, M29F002BNT, M29F002BNB Figure 4. Data Polling Flowchart START READ DQ5 & DQ7 at VALID ADDRESS DQ7 YES = DATA NO NO DQ5 = 1 YES READ DQ7 at VALID ADDRESS DQ7 YES = DATA NO FAIL Table 8. Status Register Bits Operation Program Program During Erase Suspend Program Error ...
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... Table 10. Capacitance ( ° MHz) A Symbol Parameter C Input Capacitance IN C Output Capacitance OUT Sampled only, not 100% tested. M29F002BT, M29F002BB, M29F002BNT, M29F002BNB High Speed 30pF 10ns 1.5V Figure 7. AC Testing Load Circuit 1.5V DEVICE UNDER TEST 2.0V 0.8V AI01275B C L includes JIG capacitance ...
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... M29F002BT, M29F002BB, M29F002BNT, M29F002BNB Table 11. DC Characteristics ( 70°C, –40 to 85°C or –40 to 125°C) A Symbol Parameter (1) Input Leakage Current Leakage Current High LR1 I RP Leakage Current Low LR2 I Output Leakage Current LO I Supply Current (Read) CC1 I Supply Current (Standby) TTL ...
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... Chip Enable, Output Enable or EHQX t t Address Transition to Output GHQX OH Transition t AXQX Note: 1. Sampled only, not 100% tested. Figure 8. Read Mode AC Waveforms A0-A17 E G DQ0-DQ7 M29F002BT, M29F002BB, M29F002BNT, M29F002BNB Parameter Test Condition ...
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... M29F002BT, M29F002BB, M29F002BNT, M29F002BNB Table 13. Write AC Characteristics, Write Enable Controlled ( 70°C, –40 to 85°C or –40 to 125°C) A Symbol Alt t t Address Valid to Next Address Valid AVAV Chip Enable Low to Write Enable Low ELWL Write Enable Low to Write Enable High ...
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... EHGL OEH High to Write Enable Low VCHWL VCS CC Figure 10. Write AC Waveforms, Chip Enable Controlled A0-A17 DQ0-DQ7 V CC tVCHWL M29F002BT, M29F002BB, M29F002BNT, M29F002BNB Parameter Min Min Min Min Min Min Min Min Min Min Min Min tAVAV VALID tAVEL tWLEL ...
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... M29F002BT, M29F002BB, M29F002BNT, M29F002BNB Table 15. Reset/Block Temporary Unprotect AC Characteristics ( 70°C, –40 to 85°C or –40 to 125°C) Symbol Alt (1) t PHWL RP High to Write Enable Low, Chip Enable t t PHEL RH Low, Output Enable Low (1) t PHGL Pulse Width PLPX RP (1) ...
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... For a list of available options (Speed, Package, etc...) or for further information on any aspect of this de- vice, please contact the ST Sales Office nearest to you. M29F002BT, M29F002BB, M29F002BNT, M29F002BNB M29F002BB 45 ...
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... M29F002BT, M29F002BB, M29F002BNT, M29F002BNB Table 17. PLCC32 – 32 lead Plastic Leaded Chip Carrier, Package Mechanical Data Symbol Typ 7. 10. 0.89 Note: Drawing is not to scale. Figure 12. PLCC32 – 32 lead Plastic Leaded Chip Carrier, Package Outline D1 E3 ...
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... Table 18. TSOP32 – 32 lead Plastic Thin Small Outline 20mm, Package Mechanical Data Symbol Typ 0. Figure 13. TSOP32 – 32 lead Plastic Thin Small Outline 20mm, Package Outline TSOP-a Note: Drawing is not to scale. M29F002BT, M29F002BB, M29F002BNT, M29F002BNB millimeters Min Max 1.20 0.05 0.15 0.95 1.05 0.15 0.27 0.10 0.21 19.80 20.20 18.30 18.50 7.90 8.10 – ...
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... M29F002BT, M29F002BB, M29F002BNT, M29F002BNB Table 1. Revision History Date Rev. July 1999 -01 First Issue Chip Erase Max. specification added (Table 7) Block Erase Max. specification added (Table 7) Program Max. specification added (Table 7) 07-Oct-1999 -02 Chip Program Max. specification added (Table 7) I and I CC1 I Test Condition changed (Table 11) ...
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... Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States. M29F002BT, M29F002BB, M29F002BNT, M29F002BNB The ST logo is registered trademark of STMicroelectronics All other names are the property of their respective owners © ...