lh28f008sc Sharp Microelectronics of the Americas, lh28f008sc Datasheet - Page 22

• Manufacturer Part Number: lh28f008sc
• Description: 8m 1m ? 8 Flash Memory
• Manufacturer: Sharp Microelectronics of the Americas

LH28F008SC
Capacitance
NOTE:
1. Sampled, not 100% tested.
AC INPUT/OUTPUT TEST CONDITIONS
Waveform for V
22
SYMBOL
0.45
NOTE:
AC test inputs are driven at 3.0 V for a Logic '1' and 0.0 V for a
Logic '0'. Input timing begins and output timing ends at 1.5 V.
Input rise and fall times (10% to 90%) < 10 ns.
NOTE:
AC test inputs are driven at V
(0.45 V
and V
and fall times (10% to 90%) < 10 ns.
3.0
0.0
2.4
T
C
Figure 12. Transient Input/Output Reference
Figure 13. Transient Input/Output Reference
C
A
OUT
IN
INPUT
= +25°C, f = 1 MHz
INPUT
IL
TTL
(0.8 V
(High Speed Testing Configuration)
(Standard Testing Configuration)
) for a Logic '0'. Input timing begins at V
Waveform for V
Input Capacitance
Output Capacitance
TTL
1.5
). Output timing ends at V
PARAMETER
2.0
0.8
CC
= 3.3 V ±0.3 V and V
TEST POINTS
TEST POINTS
OH
(2.4 V
CC
= 5 V ±10%
TTL
TYP.
) for a Logic '1' and V
IH
6
8
and V
CC
IH
1.5
MAX.
IL
(2.0 V
2.0
0.8
. Input rise
12
= 5 V ±5%
8
OUTPUT
28F008SC-12
28F008SC-13
OUTPUT
TTL
UNITS
)
OL
pF
pF
V
V
IN
OUT
Test Configuration Capacitance
Loading Value
NOTE: C
CONDITIONS
= 0.0 V
TEST CONFIGURATION
= 0.0 V
V
V
V
CC
CC
CC
= 3.3 V ± 0.3 V
L
= 5 V ± 0.5%
= 5 V ± 10%
Figure 14. Transient Equivalent
Includes Jig Capacitance
DEVICE
UNDER
TEST
Testing Load Circuit
8M (1M × 8) Flash Memory
1.3 V
R
1N914
C
L
L
= 3.3 k
OUT
C
L
100
50
30
(pF)
28F008SC-14