cy7c1380d-250bzxi Cypress Semiconductor Corporation., cy7c1380d-250bzxi Datasheet - Page 19

• Manufacturer Part Number: cy7c1380d-250bzxi
• Description: 18-mbit 512k X 36/1m X 18 Pipelined Sram
• Manufacturer: Cypress Semiconductor Corporation.

AC Test Loads and Waveforms
Capacitance
Thermal Resistance
Document #: 38-05543 Rev. *E
C
C
C
Θ
Θ
Note:
19. Tested initially and after any design or process change that may affect these parameters.
Parameter
Parameter
3.3V IO Test Load
IN
CLK
IO
OUTPUT
OUTPUT
2.5V IO Test Load
JA
JC
Input Capacitance
Clock Input Capacitance
Input/Output Capacitance
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Z
Z
[19]
0
0
= 50Ω
= 50Ω
Description
Description
(a)
(a)
V
V
T
[19]
T
= 1.25V
= 1.5V
R
R
L
L
= 50Ω
= 50Ω
OUTPUT
OUTPUT
T
V
V
Test conditions follow standard
test methods and procedures
for measuring thermal
impedance, in accordance with
EIA/JESD51.
3.3V
2.5V
INCLUDING
A
DD
DDQ
= 25°C, f = 1 MHz,
JIG AND
= 3.3V.
INCLUDING
SCOPE
= 2.5V
Test Conditions
Test Conditions
JIG AND
SCOPE
5 pF
5 pF
(b)
(b)
R = 317Ω
R = 1667Ω
R = 351Ω
R = 1538Ω
100 TQFP
100 TQFP
Package
Package
28.66
4.08
V
GND
GND
V
DDQ
5
5
5
DDQ
≤ 1 ns
≤ 1 ns
CY7C1380D, CY7C1380F
CY7C1382D, CY7C1382F
10%
10%
119 BGA
Package
119 BGA
Package
23.8
6.2
8
8
8
ALL INPUT PULSES
ALL INPUT PULSES
90%
90%
165 FBGA
165 FBGA
Package
Package
(c)
(c)
20.7
4.0
9
9
9
Page 19 of 30
90%
90%
10%
10%
°C/W
°C/W
Unit
Unit
pF
pF
pF
≤ 1 ns
≤ 1 ns
[+] Feedback