si3200-x-gs Silicon Laboratories, si3200-x-gs Datasheet - Page 66

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si3200-x-gs

Manufacturer Part Number
si3200-x-gs
Description
Dual Programmable Cmos Slic With Line Monitoring
Manufacturer
Silicon Laboratories
Datasheet
Si3232
DIAG: Diagnostic Tools (Register Address 13)
(Register type: Diagnostics)
Reset settings = 0x00
66
Name
Type
Bit
2:0
Bit
7
6
5
4
3
SDIAGIN[2:0]
TSTRING
IQ2HR
TXFILT
R/W
SDIAG
IQ2HR
IQ1HR
Name
D7
IQ1HR
R/W
D6
Monitor ADC IQ2 High-Resolution Enable.
Sets MADC to high-resolution range for IQ2 conversion.
0 = MADC not set to high resolution.
1 = MADC set to high resolution.
Monitor ADC IQ1 High-Resolution Enable.
Sets MADC to high-resolution range for IQ1 conversion.
0 = MADC not set to high resolution.
1 = MADC set to high resolution.
Test Ringing Generator Enable.
Enables the capability of generating a low-level ringing signal for diagnostic purposes.
0 = Test-ringing generator disabled.
1 = Test-ringing generator enabled.
Transmit Path Audio Diagnostics Filter Enable.
Enables the transmit path diagnostics filters.
0 = Transmit audio path diagnostics filters disabled.
1 = Transmit audio path diagnostics filters enabled.
SLIC Diagnostics Filter Enable.
Enables the SLIC path diagnostics filters.
0 = SLIC diagnostics filters disabled.
1 = SLIC diagnostics filters enabled.
SLIC Diagnostics Filter Input.
Selects the input to the SLIC diagnostics filter for dc and low-frequency line parameters.
000 = TIP voltage.
001 = RING voltage.
010 = Loop voltage, V
011 = Longitudinal voltage, (V
100 = Loop (metallic) current.
101 = Longitudinal current.
TSTRING
R/W
D5
TXFILT
Preliminary Rev. 0.96
R/W
TIP
D4
– V
RING
TIP
SDIAG
.
+ V
R/W
D3
RING
Function
)/2.
D2
SDIAGIN[2:0]
R/W
D1
D0

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