cy24c01 Cypress Semiconductor Corporation., cy24c01 Datasheet - Page 9

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cy24c01

Manufacturer Part Number
cy24c01
Description
1 Kbit, 2 Kbit, 4 Kbit, 8 Kbit, And 16 Kbit X8 Two Wire I2c Serial Eeprom
Manufacturer
Cypress Semiconductor Corporation.
Datasheet
Capacitance
In the following table, the capacitance parameters are listed.
Thermal Resistance
In the following table, the thermal resistance parameters are listed.
Reliability Characteristics
In the following table, the reliability characteristics parameters are listed.
AC test inputs are driven at V
and outputs are V
Note
Document #: 001-15632 Rev. *C
C
C
N
T
I
7. This parameter is measured only for initial qualification and after a design or process change that could affect this parameter.
LTH
Parameter
DR
IN
IO
END
Parameter
Θ
Θ
Parameter
JA
JC
V
V
IHT
Endurance
Data Rentention
Latch Up
ILT
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
100 KHz, 400 KHz
LT
Description
(V
Frequency
Description
CC
1 MHz
Input Capacitance
(A0,A1, A2, SCL)
Input/Output Capaci-
tance (SDA)
INPUT
/2 - 0.1V) and V
Description
IHT
(0.9 V
Figure 10. AC Input and Output Reference Waveforms
JEDEC Standard A117
JEDEC Standard A103
JEDEC Standard 78
CC
Test conditions follow standard test methods and proce-
dures for measuring thermal impedance, per EIA /
JESD51.
HT
) for a logic ‘1’ and V
OUTPUT
Figure 9. AC Test Loads and Waveforms
(V
CC
T
V
V
V
A
CC
/2 + 0.1V). Input rise and fall times (10%–90%) are <100 ns.
HT
LT
= 25°C, f = 1 MHz,
VCC
= 1.65V
Test Method
Test Conditions
Test Conditions
[7]
R (ohm)
REFERENCE POINTS
ILT
1.2K
2.7K
(0.1 V
[7]
CC
[7]
) for a logic ‘0’. Measurement reference points for inputs
R
C
L
V
V
HT
LT
CY24C01/02/04/08/16
Max
100 + I
6
8
1 Million
8-SOIC
120.83
C
90.31
Min
100
L
100
30
(pF)
OUTPUT
CC
8-TSSOP
119.31
82.77
Unit
Page 9 of 16
pF
pF
Cycles
Years
Unit
mA
°C/W
°C/W
Unit
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