SGA-8343X Stanford Microdevices, SGA-8343X Datasheet - Page 6

• Manufacturer Part Number: SGA-8343X
• Description: Reliability Qualification Report
• Manufacturer: Stanford Microdevices

Test Conditions
Number of
Devices Under
Test
Test Conditions
Number of
Devices Under
Test
Test Conditions
Number of
Devices Under
Test
Test Conditions
Number of
Devices Under
Test
Test Conditions
Number of
Devices Under
Test
Group D
Group E
Group F
Group G
Group H
SGA-8343X Reliability Qualification Report
Power Temperature Cycle
Temperature = -40°C to 85°C, Asynchronous bias, Test Duration = 168
hours
20
Low Temperature Storage
Temperature = -40°C, Test Duration = 1000 hours
20
High Temperature Storage
Temperature = 150°C, Test Duration = 1000 hours
22
Solderability Steam Age
Temperature = 215°C, Test Duration = 60 seconds
15
Solderability Steam Age
Temperature = 245°C, Test Duration = 60 seconds
15
Test
Standard
Test
Standard
Test
Standard
Test
Standard
Test
Standard
JESD22-
A109(A)
SMDI Internal
JESD22-
A103(B)
JESD22-
B102(C)
Condition A
JESD22-
B102(C)
Condition B
Results
Results
Results
Results
Results
PASS
PASS
PASS
PASS
PASS