83C576 Philips Semiconductors, 83C576 Datasheet - Page 30

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83C576

Manufacturer Part Number
83C576
Description
80C51 8-bit microcontroller family 8K/256 OTP/ROM/ 6 channel 10-bit A/D/ 4 comparators/ failure detect circuitry/ watchdog timer
Manufacturer
Philips Semiconductors
Datasheet
Philips Semiconductors
DC ELECTRICAL CHARACTERISTICS
T
NOTES:
1. Typical ratings are not guaranteed. The values listed are at room temperature, 5V.
2. Capacitive loading on ports 0 and 2 may cause spurious noise to be superimposed on the V
3. Capacitive loading on ports 0 and 2 may cause the V
4. Pins of ports 1, 2 and 3 source a transition current when they are being externally driven from 1 to 0. The transition current reaches its
5. I
6. See Figures 34 through 37 for I
7. Load capacitance for port 0, ALE, and PSEN = 100pF, load capacitance for all other outputs = 80pF.
8. Under steady state (non-transient) conditions, I
9. 20pF MAX for CERDIP package; 15pF MAX for all other packages.
1998 Jun 04
amb
SYMBOL
V
V
V
V
V
HYS
V
V
V
V
V
V
V
I
I
I
I
I
R
V
C
IL
IH
L2
LA
CC
IL
IL1
IL2
IH
IH1
OL
OL1
OH
OH1
OH2
IO
CR
LOW
80C51 8-bit microcontroller family
8K/256 OTP/ROM, 6 channel 10-bit A/D, 4 comparators,
failure detect circuitry, watchdog timer
RST
IO
to external bus capacitance discharging into the port 0 and port 2 pins when these pins make 1-to-0 transitions during bus operations. In the
worst cases (capacitive loading > 100pF), the noise pulse on the ALE pin may exceed 0.8V. In such cases, it may be desirable to qualify
ALE with a Schmitt Trigger, or use an address latch with a Schmitt Trigger STROBE input. I
single output sinks more than 5mA and no more than two outputs exceed the test conditions.
address bits are stabilizing.
maximum value when V
If I
test conditions.
CC
= 0 C to +70 C, –40 C to +85 C, and –40 C to +125 C; V
OL
MAX at other frequencies can be determined from Figure 33.
Maximum I
Maximum I
Maximum total I
exceeds the test condition, V
Input low voltage (except Port 1, EA)
Input low voltage (EA)
Input low voltage (Port 1)
Input high voltage (except Port 1, XTAL1, RST)
Input high voltage (XTAL1, RST, Port 1)
Hysteresis voltage (Port 1)
Output voltage low (Ports 1, 2, 3)
Output voltage low (Ports 0, ALE, PSEN
Output voltage high (Ports 1, 2, 3 in push-pull mode)
Output voltage high (Port 0, ALE, PSEN)
Output voltage high in weak pullup mode (Port 0, 2, 3)
Offset voltage comparator inputs
Common mode range comparator inputs
Logical 0 input current (Ports 0, 2, 3) (weak pull-up)
Input pulldown current (Port 0, Port2 in open drain mode)
Input leakage current (EA, P0. 2. 3 High-Z)
Input leakage current comparator/ADC inputs
Power supply current:
Internal reset pull-up resistor
Low V
Pin capacitance
Active mode @ 16MHz
Idle mode @ 16MHz
Power-down mode
OL
OL
CC
per port pin:
per 8-bit port:
detect voltage
OL
for all outputs:
IN
9
is between V
CC
7
PARAMETER
5
test conditions.
OL
may exceed the related specification. Pins are not guaranteed to sink current greater than the listed
IH
10mA
26mA
71mA
and V
OL
IL
.
)
must be externally limited as follows:
OH
on ALE and PSEN to momentarily fall below the 0.9V
CC
= 5V 10%, V
30
0.45 < V
0.45 < V
CONDITIONS
I
I
0 < V
OH
OH
I
I
I
V
OH
OL
OL
See note 6
I
I
f = 1MHz
IN
V
IH
IH
SS
TEST
= –1.6mA
= –3.2mA
IN
= 1.6mA
= 3.2mA
= –10 A
= 0.45V
< 2mA
< 2mA
IN
= 0V
= 0V
IN
IN
< V
< V
< V
CC
CC
CC
OL
OL
0.2V
V
V
V
0.7V
s of ALE and ports 1 and 3. The noise is due
can exceed these conditions provided that no
CC
CC
CC
MIN
–0.5
–0.5
–0.5
–1.0
3.75
200
–35
–10
CC
50
0
2
–1.0
–0.7
–1.0
CC
+0.9
LIMITS
TYP
20
83C576/87C576
8
5
CC
1
specification when the
0.2V
0.2V
V
V
0.3V
Product specification
CC
CC
MAX
–250
0.45
0.45
V
+1.0
4.25
+35
+10
CC
200
CC
40
30
12
75
15
CC
+0.5
+0.5
–0.45
CC
–0.1
UNIT
mV
mV
mA
mA
k
pF
V
V
V
V
V
V
V
V
V
V
V
V
A
A
A
A
A

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