L64767 LSI Logic Corporation, L64767 Datasheet - Page 15
L64767
Manufacturer Part Number
L64767
Description
Smatv Qam Encoder
Manufacturer
LSI Logic Corporation
Datasheet
1.L64767.pdf
(32 pages)
Test Signals
The eight signals described below control functions such as chip-level,
full scan tests, JTAG tests, and internal RAM tests. Five pins (TCK, TDI,
TDO, TMS, and TRST) are used for JTAG tests. The other three pins are
for SCAN_ENABLE, SCAN_MODE, and T_N (test output enable). Note
that the L64767 is in normal functional mode when SCAN_ENABLE,
SCAN_MODE, TCK, TDI, TMS, T_N, and TRST are left unconnected.
SCAN_ENABLE
SCAN_MODE Scan Mode
TCK
TDI
TDO
TMS
T_N
L64767 SMATV QAM Encoder
Scan Enable
This is a level-sensitive data signal with a pull-down
resistor. When HIGH, this signal enables scan chain shift.
In default normal operation, SCAN_ENABLE is LOW.
This is a level-sensitive signal with a pull-down resistor.
When this signal is HIGH, the chip is switched to scan
test mode. In default normal operation, SCAN_MODE is
LOW.
Test Mode Clock
When HIGH, this is a rising or falling edge signal for the
JTAG test mode clock. In default normal operational
mode, TCK is LOW.
Test Data Input
When HIGH, this level-sensitive signal provides JTAG
data input. In default normal operational mode, TDI is
LOW.
Test Data
This is the JTAG data output.
Test Mode Select
When HIGH, this level-sensitive signal enables the JTAG
test mode. In default normal operational mode, TMS is
LOW.
Test Output Enable
This is an active LOW signal with a pull-up resistor that
disables the test mode when T_N is LOW. It switches all
3-stated buffers to high-impedance mode for test or
device selection on a common bus. In default normal
operation, T_N is HIGH.
Output
Input
Input
Input
Input
Input
Input
15