1104R24M00000AF Vectron International, Inc., 1104R24M00000AF Datasheet - Page 6

• Manufacturer Part Number: 1104R24M00000AF
• Description: IC SMD CRYSTAL OSC. 24MHZ 5V 20FLATPACK
• Manufacturer: Vectron International, Inc.

SIZE
A
4.3.5 Operating Characteristics. Symmetrical square wave limits are dependent on the device
4.3.6 Output Load. Standard TTL (6 or 10) and ACMOS (10k , 15pF) test loads are in
5.
5.1
5.1.1 Screening Options. The Screening Options, by letter, are summarized as:
5.2
CODE IDENT NO.
00136
frequency and are in accordance with Tables 2 and 2A. Waveform measurement points
and logic limits are in accordance with MIL-PRF-55310. Start-up time is 10.0 msec.
maximum.
accordance with MIL-PRF-55310.
QUALITY ASSURANCE PROVISIONS AND VERIFICATION
Verification and Test. Device lots shall be tested prior to delivery in accordance with the
applicable Screening Option letter as stated by the 15
Table 5 tests are conducted in the order shown and annotated on the appropriate process
travelers and data sheets of the governing test procedure.
Optional Design, Test and Data Parameters. The following is a list of design, assembly,
inspection and test options that can be selected or added by purchase order request.
a. Design Pedigree (choose one as the 5
b. Input Voltage, (A) for 5.0V, (B) for 3.3V as the 14
c. Frequency-Temperature Slew Test
d. Radiographic Inspection
e. Group C Inspection: MIL-PRF-55310
f. Group C Inspection: MIL-PRF-38534
g. Internal Water-Vapor Content (RGA) samples and test performance
h. MTBF Reliability Calculations
i. Worst Case/Derating Analysis
j. Deliverable Process Identification Documentation (PID)
k. Customer Source Inspection (pre-cap / final)
A
B
C
D
E
F
G
X
(R) Hi-Rel design w/ 100krad Class S die, Premium Q Swept Quartz
(V) Hi-Rel design w/ 100krad Class S die, Cultured Quartz
(X) Hi-Rel design w/ Cultured Quartz, Class S die
(B) Hi-Rel design w/ Swept Quartz, Class B die
(C) Hi-Rel design w/ Cultured Quartz, Class B die
(D) Hi-Rel design w/ Cultured Quartz and commercial grade components
Modified MIL-PRF-38534 Class K
Modified MIL-PRF-55310 Class B Screening & Group A Quality
Conformance Inspection (QCI)
Modified MIL-PRF-55310 Class S Screening & Group A QCI
Modified MIL-PRF-38534 Class K with Burn-in Delta Aging
Modified MIL-PRF-55310 Class B Screening, Groups A & B QCI
MIL-PRF-55310 Class S Screening, Groups A & B QCI
MIL-PRF-55310 Class B Screening & Group A QCI
Engineering Model (EM)
UNSPECIFIED TOLERANCES
N/A
th
character in the part number):
th
character of the part number.
th
OS-68338
DWG NO.
character
REV.
G
SHEET
6