1104R24M00000AF Vectron International, Inc., 1104R24M00000AF Datasheet - Page 4

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1104R24M00000AF

Manufacturer Part Number
1104R24M00000AF
Description
IC SMD CRYSTAL OSC. 24MHZ 5V 20FLATPACK
Manufacturer
Vectron International, Inc.
Datasheet
SIZE
A
3.4.3 Assembly. Manufacturing utilizes standardized procedures, processes and verification
3.4.4 Inspection. The inspection requirements of MIL-PRF-55310 apply to all devices
3.4.5 Test. The Screening test matrix of Table 5 is tailored for selectable-combination testing
3.4.6 Marking. Device marking shall be in accordance with the requirements of MIL-PRF-
3.4.7 Ruggedized COTS Design Implementation. Design Pedigree D devices (see ¶ 5.2) use
4.
4.1
4.1.1 Crystals. Cultured quartz crystal resonators are used to provide the selected frequency
4.1.2 Passive Components. Established Reliability (ER) failure level R passive components
4.1.3 Class S Microcircuits. Microcircuits are procured from wafer lots that have passed MIL-
CODE IDENT NO.
00136
f. Heterojunction Bipolar Transistor (HBT) technology.
methods to produce MIL-PRF-55310 Class S / MIL-PRF-38534 Class K equivalent
devices. MIL-PRF-38534 Group B Option 1 in-line inspection is included on radiation
hardened part numbers to further verify lot pedigree. Traceability of all components and
production lots are in accordance with MIL-PRF-38534, as a minimum. Tabulated
records are provided as a part of the deliverable data package. Devices are handled in
accordance with MIL-STD-1686 for Class 1 devices.
delivered to this document. Inspection conditions and standards are documented in
accordance with the Quality Assurance, ISO-9001 derived, System of QSP-90100.
to eliminate costs associated with the development/maintenance of device-specific
documentation packages while maintaining performance integrity.
55310.
the same robust designs found in the other device pedigrees. They do not include the
provisions of traceability or the Class-qualified componentry noted in paragraphs 3.4.3
and 4.1.
DETAIL REQUIREMENTS
Components
for the devices. The optional use of Premium Q swept quartz can, because of its
processing to remove impurities, be specified for better frequency aging characteristics.
In accordance with MIL-PRF-55310, the manufacturer has a documented crystal element
evaluation program.
are procured from QPL suppliers. Lot evaluations are in accordance with MIL-PRF-
55310.
PRF-55310 Lot Acceptance Tests for Class S devices. The prescribed die carries a Class
2 ESDS classification in accordance with MIL-PRF-38535. When optionally specified,
further testing in accordance with MIL-PRF-55310 and MIL-PRF-38534 is performed for
UNSPECIFIED TOLERANCES
N/A
OS-68338
DWG NO.
REV.
G
SHEET
4

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