AD5755-1 Analog Devices, AD5755-1 Datasheet - Page 12

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AD5755-1

Manufacturer Part Number
AD5755-1
Description
Quad Channel, 16-Bit, Serial Input, 4-20mA & Voltage Output DAC, Dynamic Power Control, HART Connectivity
Manufacturer
Analog Devices
Datasheet

Specifications of AD5755-1

Resolution (bits)
16bit
Dac Update Rate
91kSPS
Dac Settling Time
11µs
Max Pos Supply (v)
+33V
Single-supply
No
Dac Type
I or V Out
Dac Input Format
SPI

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Part Number
Manufacturer
Quantity
Price
Part Number:
AD5755-1ACPZ-REEL7
Manufacturer:
AD
Quantity:
201
AD5755-1
ABSOLUTE MAXIMUM RATINGS
T
100 mA do not cause SCR latch-up.
Table 4.
Parameter
AV
AV
AV
AV
DV
Digital Inputs to DGND
Digital Outputs to DGND
REFIN, REFOUT to AGND
V
+V
I
SW
AGND, GNDSW
Operating Temperature Range (T
Storage Temperature Range
Junction Temperature (T
64-Lead LFCSP
Power Dissipation
Lead Temperature
1
2
OUT_x
Power dissipated on chip must be derated to keep the junction temperature
below 125°C.
Based on a JEDEC 4-layer test board.
OUT_x
A
Industrial
θ
Soldering
DD
SS
DD
CC
SENSE_x
DD
x
= 25°C, unless otherwise noted. Transient currents of up to
JA
to AGND
, V
to AGND, DGND
to AGND
to AGND
to AV
to DGND
to AGND
Thermal Impedance
BOOST_x
to AGND
SS
1
to AGND, DGND
x
to DGND
J
max)
2
A
)
Rating
−0.3 V to +33 V
+0.3 V to −28 V
−0.3 V to +60 V
−0.3 V to +7 V
−0.3 V to +7 V
−0.3 V to DV
−0.3 V to DV
(whichever is less)
−0.3 V to AV
(whichever is less)
AV
the dc-to-dc circuitry
AV
the dc-to-dc circuitry
AV
the dc-to-dc circuitry
−0.3 to +33 V
−0.3 V to +0.3 V
−40°C to +105°C
−65°C to +150°C
125°C
20°C/W
(T
JEDEC industry standard
J-STD-020
J
(whichever is less)
SS
SS
SS
max − T
to V
to V
to V
BOOST_x
BOOST_x
BOOST_x
A
)/θ
DD
DD
DD
JA
+ 0.3 V or +7 V
or 33 V if using
or 33 V if using
or 33 V if using
+ 0.3 V or +7 V
+ 0.3 V or +7 V
Rev. B | Page 12 of 52
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
Data Sheet

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