SAM7S16 Atmel Corporation, SAM7S16 Datasheet - Page 221

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SAM7S16

Manufacturer Part Number
SAM7S16
Description
Manufacturer
Atmel Corporation
Datasheets

Specifications of SAM7S16

Flash (kbytes)
16 Kbytes
Pin Count
48
Max. Operating Frequency
55 MHz
Cpu
ARM7TDMI
Hardware Qtouch Acquisition
No
Max I/o Pins
21
Ext Interrupts
21
Usb Speed
No
Usb Interface
No
Spi
1
Twi (i2c)
1
Uart
2
Ssc
1
Graphic Lcd
No
Video Decoder
No
Camera Interface
No
Adc Channels
8
Adc Resolution (bits)
10
Adc Speed (ksps)
384
Resistive Touch Screen
No
Temp. Sensor
No
Crypto Engine
No
Sram (kbytes)
4
Self Program Memory
NO
Dram Memory
No
Nand Interface
No
Picopower
No
Temp. Range (deg C)
-40 to 85
I/o Supply Class
1.8/3.3
Operating Voltage (vcc)
3.0 to 3.6
Fpu
No
Mpu / Mmu
no / no
Timers
3
Output Compare Channels
3
Input Capture Channels
3
Pwm Channels
4
32khz Rtc
Yes
Calibrated Rc Oscillator
No
B.1
B.1.1
ARM DDI 0029G
Scan chains and JTAG interface
Scan chain implementation
There are three JTAG-style scan chains within the ARM7TDMI core. These enable
debugging and configuration of EmbeddedICE Logic.
A JTAG style Test Access Port (TAP) controller controls the scan chains. For further
details of the JTAG specification, refer to IEEE Standard 1149.1 - 1990 Standard Test
Access Port and Boundary-Scan Architecture.
In addition, support is provided for an optional fourth scan chain. This is intended to be
used for an external boundary-scan chain around the pads of a packaged device. The
control signals provided for this scan chain are described in Scan chain 3 on page B-20.
The scan cells are not fully JTAG compliant.
The following sections describe:
The three scan paths are referred to as:
1.
2.
3.
The scan chains are shown in Figure B-1 on page B-4.
Scan chain implementation on page B-3
TAP state machine on page B-5.
Scan chain 0 on page B-4
Scan chain 1 on page B-4
Scan chain 2 on page B-4.
Note
Copyright © 1994-2001. All rights reserved.
Debug in Depth
B-3

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