STM32F407IGT6 STMicroelectronics, STM32F407IGT6 Datasheet - Page 87

• Manufacturer Part Number: STM32F407IGT6
• Description: IC MCU 32BIT 1MB FLASH 176LQFP
• Manufacturer: STMicroelectronics

Specifications of STM32F407IGT6

• Core Processor: ARM Cortex-M4
• Core Size: 32-Bit
• Speed: 168MHz
• Connectivity: CAN, I²C, IrDA, LIN, SPI, UART/USART, USB OTG
• Peripherals: Brown-out Detect/Reset, DMA, I²S, POR, PWM, WDT
• Number Of I /o: 140
• Program Memory Size: 1MB (1M x 8)
• Program Memory Type: FLASH
• Eeprom Size: -
• Ram Size: 192K x 8
• Voltage - Supply (vcc/vdd): 1.8 V ~ 3.6 V
• Data Converters: A/D 24x12b; D/A 2x12b
• Oscillator Type: Internal
• Operating Temperature: -40°C ~ 85°C
• Package / Case: *
• Core: ARM Cortex M4
• Processor Series: STM32F4
• Data Bus Width: 32 bit
• Maximum Clock Frequency: 168 MHz
• Data Ram Size: 192 KB
• On-chip Adc: Yes
• Number Of Programmable I/os: 140
• Number Of Timers: 10
• Operating Supply Voltage: 1.7 V to 3.6 V
• Mounting Style: SMD/SMT
• A/d Bit Size: 12 bit
• A/d Channels Available: 24
• Interface Type: CAN, I2C, I2S, SPI, UART
• Lead Free Status / Rohs Status: Lead free / RoHS Compliant
• Other names: 497-11604

STM32F405xx, STM32F407xx
Table 41.
5.3.15
Symbol
LU
Static latchup
Two complementary static tests are required on six parts to assess the latchup
performance:
●
●
These tests are compliant with EIA/JESD 78A IC latchup standard.
Electrical sensitivities
I/O current injection characteristics
As a general rule, current injection to the I/O pins, due to external voltage below V
above V
operation. However, in order to give an indication of the robustness of the microcontroller in
cases when abnormal injection accidentally happens, susceptibility tests are performed on a
sample basis during device characterization.
Functional susceptibilty to I/O current injection
While a simple application is executed on the device, the device is stressed by injecting
current into the I/O pins programmed in floating input mode. While current is injected into the
I/O pin, one at a time, the device is checked for functional failures.
The failure is indicated by an out of range parameter: ADC error above a certain limit (>5
LSB TUE), out of spec current injection on adjacent pins or other functional failure (for
example reset, oscillator frequency deviation).
The test results are given in
Table 42. I/O current injection susceptibility
Static latch-up class
Symbol
I
A supply overvoltage is applied to each power supply pin
A current injection is applied to each input, output and configurable I/O pin
INJ
Parameter
DD
(for standard, 3 V-capable I/O pins) should be avoided during normal product
Injected current on all FT pins
Injected current on any other pin
T
Description
A
Table
= +105 °C conforming to JESD78A
Doc ID 022152 Rev 1
42.
Conditions
Functional susceptibility
Negative
injection
–5
–5
Electrical characteristics
injection
Positive
+0
+5
II level A
Class
SS
Unit
mA
or
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