AM29F016D-90SC AMD (ADVANCED MICRO DEVICES), AM29F016D-90SC Datasheet - Page 10
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AM29F016D-90SC
Manufacturer Part Number
AM29F016D-90SC
Description
Manufacturer
AMD (ADVANCED MICRO DEVICES)
Datasheet
1.AM29F016D-90SC.pdf
(13 pages)
Specifications of AM29F016D-90SC
Lead Free Status / Rohs Status
Not Compliant
PRODUCT TEST FLOW
Figure 1 provides an overview of AMD’s Known Good
Die test flow. For more detailed information, refer to the
Am29F016D product qualification database supple-
ment for KGD. AMD implements quality assurance pro-
cedures throughout the product test flow. In addition,
March 3, 2009 26244A4
Packaging for Shipment
24 hours at 250°C
High Temperature
Figure 1. AMD KGD Product Test Flow
Wafer Sort 1
Wafer Sort 3
Wafer Sort 2
Shipment
Am29F016D Known Good Die
Bake
S U P P L E M E N T
an off-line quality monitoring program (QMP) further
guarantees AMD quality standards are met on Known
Good Die products. These QA procedures also allow
AMD to produce KGD products without requiring or
implementing burn-in.
Data Retention
Incoming Inspection
Wafer Saw
Die Separation
100% Visual Inspection
Die Pack
DC Parameters
Functionality
Programmability
Erasability
DC Parameters
Functionality
Programmability
Erasability
DC Parameters
Functionality
Programmability
Erasability
Speed
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