LFX125EB-04F256I Lattice, LFX125EB-04F256I Datasheet - Page 59
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LFX125EB-04F256I
Manufacturer Part Number
LFX125EB-04F256I
Description
IC FPGA 139K GATES 256-BGA
Manufacturer
Lattice
Datasheet
1.LFX125EB-03F256C.pdf
(115 pages)
Specifications of LFX125EB-04F256I
Lead Free Status / Rohs Status
Contains lead / RoHS non-compliant
Other names
220-1238
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Price
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Manufacturer:
Lattice Semiconductor Corporation
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Lattice Semiconductor
Switching Test Conditions
Figure 25 shows the output test load that is used for AC testing. The specific values for resistance, capacitance,
voltage, and other test conditions are shown in Table 7.
Figure 25. Output Test Load, LVTTL and LVCMOS Standards
Table 7. Text Fixture Required Components
LVCMOS I/O, (L -> H, H -> L)
Default LVCMOS 1.8 I/O (Z -> H)
Default LVCMOS 1.8 I/O (Z -> L)
Default LVCMOS 1.8 I/O (H -> Z)
Default LVCMOS 1.8 I/O (L -> Z)
Note: Output test conditions for all other interfaces are determined by the respective standards.
Test Condition
Device
Output
*C
L
includes test fixture and probe capacitance.
106
106
106
R
∞
∞
1
106
106
106
R
∞
∞
2
35pF
35pF
35pF
5pF
5pF
C
L
V
R 1
R 2
59
CCO
LVCMOS 3.3 = V
LVCMOS 2.5 = V
LVCMOS 1.8 = V
Timing Reference
C L *
V
V
OL
OH
0.9V
0.9V
+ 0.3
- 0.3
Point
Test
CCO
CCO
CCO
ispXPGA Family Data Sheet
/2
/2
/2
LVCMOS 1.8 = 1.65V
LVCMOS 3.3 = 3.0V
LVCMOS 2.5 = 2.3V
VCCO
1.65V
1.65V
1.65V
1.65V
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