74HC4852PW,118 NXP Semiconductors, 74HC4852PW,118 Datasheet - Page 10

• Manufacturer Part Number: 74HC4852PW,118
• Description: IC MUX/DEMUX DUAL 4X1 16TSSOP
• Manufacturer: NXP Semiconductors
• Series: 74HCr
• Type: Analog Multiplexerr

Specifications of 74HC4852PW,118

• Package / Case: 16-TSSOP (0.173", 4.40mm Width)
• Function: Multiplexer/Demultiplexer
• Circuit: 2 x 4:1
• On-state Resistance: 59 Ohm
• Voltage Supply Source: Single Supply
• Voltage - Supply, Single/dual (±): 2 V ~ 6 V
• Current - Supply: 2µA
• Operating Temperature: -40°C ~ 125°C
• Mounting Type: Surface Mount
• Number Of Channels: 2 Channel
• On Resistance (max): 650 Ohm @ 2 V
• On Time (max): 47.5 ns @ 2 V
• Off Time (max): 100 ns @ 2 V
• Supply Voltage (max): 6 V
• Supply Voltage (min): 2 V
• Maximum Power Dissipation: 500 mW
• Maximum Operating Temperature: + 125 C
• Minimum Operating Temperature: - 40 C
• Mounting Style: SMD/SMT
• Number Of Switches: Dual
• Package: 16TSSOP
• Maximum On Resistance: 650@2V Ohm
• Maximum Propagation Delay Bus To Bus: 38@2V|20@3V|17.5@3.3V|14@4.5V|12.6@6V ns
• Maximum Low Level Output Current: 25 mA
• Multiplexer Architecture: 4:1
• Maximum Turn-off Time: 100@2V ns
• Maximum Turn-on Time: 47.5@2V ns
• Power Supply Type: Single
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant
• Other names: 74HC4852PW-T; 74HC4852PW-T; 935282089118

NXP Semiconductors
Table 8.
Voltages are referenced to GND (ground = 0 V).
74HC4852_2
Product data sheet
Symbol Parameter
C
C
Fig 6. Test circuit for measuring OFF-state leakage
Fig 8. Test circuit for measuring ON resistance
I
sw
V
V
IL
IH
current
R
V I
input capacitance
switch capacitance
V I
ON
Static characteristics
= V
I S
A
SW
nYn
nYn
E
/ I
E
SW
.
V SW
V
V
GND
V
GND
CC
CC
…continued
nZ
nZ
Conditions
S0, S1 and E
nZ; OFF-state
nYn; OFF-state
4-channel analog MUX/DEMUX with injection-current effect control
I S
A
001aag100
001aag098
Rev. 02 — 30 May 2007
I SW
V O
Fig 7. Test circuit for measuring ON-state leakage
Fig 9. Test circuit for injection current coupling
V
V
V
I
I
(1)
(2)
(1) Channel is selected by S0 and S1.
current
(1) Channel is selected by S0 and S1.
V
GND < V
IL
V
I
IL
(1)
R S
I SW
V I
< GND or V
V I
V O
I
(2)
I S
A
< V
nYn
nYn
nYn
nYn
E
CC
E
I
(1)
any disabled channel
.
selected channel
any disabled channel
> V
Min
-
-
-
selected channel
CC
.
V
GND
CC
V
GND
Typ
-
-
-
CC
74HC4852
(1)
(1)
© NXP B.V. 2007. All rights reserved.
nZ
001aag099
nZ
Max
10
40
15
001aag101
V
n.c.
V O
Unit
pF
pF
pF
10 of 20