5962-9763101QXA Cypress Semiconductor Corp, 5962-9763101QXA Datasheet - Page 5

• Manufacturer Part Number: 5962-9763101QXA
• Manufacturer: Cypress Semiconductor Corp

Specifications of 5962-9763101QXA

• Lead Free Status / Rohs Status: Not Compliant

DSCC FORM 2234
APR 97
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535
and herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
MIL-PRF-38535 or for device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered
to this drawing.
herein) involving devices acquired to this drawing is required for any change as defined in MIL-STD-973.
the option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
microcircuit group number 105 (see MIL-PRF-38535, appendix A).
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein. For device class M, sampling and inspection procedures shall be
in accordance with MIL-PRF-38535, appendix A.
on all devices prior to qualification and technology conformance inspection. For device class M, screening shall be in
accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices prior to quality conformance inspection.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
4. QUALITY ASSURANCE PROVISIONS
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
4.2.1 Additional criteria for device class M.
4.2.2 Additional criteria for device classes Q and V.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
a.
b.
c.
a.
b.
c.
(1) Dynamic burn-in (method 1015 of MIL-STD-883, test condition D; for circuit, see 4.2.1b herein).
Delete the sequence specified as initial (preburn-in) electrical parameters through interim (postburn-in)
electrical parameters of method 5004 and substitute lines 1 through 6 of table IIA herein.
The test circuit shall be maintained by the manufacturer under document revision level control and shall be made
available to the preparing or acquiring activity upon request. For device class M, the test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method
1015.
Interim and final electrical parameters shall be as specified in table IIA herein.
The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in
the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be
maintained under document revision level control of the device manufacturer's Technology Review Board
(TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity
upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable,
in accordance with the intent specified in test method 1015 of MIL-STD-883.
Interim and final electrical test parameters shall be as specified in table IIA herein.
Additional screening for device class V beyond the requirements of device class Q shall be as specified in appendix B
of MIL-PRF-38535.
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
MICROCIRCUIT DRAWING
STANDARD
SIZE
A
REVISION LEVEL
SHEET
5962-97631
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