MPC859TVR133A Freescale Semiconductor, MPC859TVR133A Datasheet - Page 14

IC MPU POWERQUICC 133MHZ 357PBGA

MPC859TVR133A

Manufacturer Part Number
MPC859TVR133A
Description
IC MPU POWERQUICC 133MHZ 357PBGA
Manufacturer
Freescale Semiconductor
Datasheet

Specifications of MPC859TVR133A

Processor Type
MPC8xx PowerQUICC 32-Bit
Speed
133MHz
Voltage
1.8V
Mounting Type
Surface Mount
Package / Case
357-PBGA
Processor Series
MPC8xx
Core
MPC8xx
Data Bus Width
32 bit
Maximum Clock Frequency
133 MHz
Maximum Operating Temperature
+ 95 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
0 C
Family Name
MPC8xx
Device Core
PowerQUICC
Device Core Size
32b
Frequency (max)
133MHz
Instruction Set Architecture
RISC
Supply Voltage 1 (typ)
1.8V
Operating Supply Voltage (max)
1.9V
Operating Supply Voltage (min)
1.7V
Operating Temp Range
0C to 95C
Operating Temperature Classification
Commercial
Mounting
Surface Mount
Pin Count
357
Package Type
BGA
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Features
-
Lead Free Status / Rohs Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
MPC859TVR133A
Manufacturer:
MOTOLOLA
Quantity:
1 045
Part Number:
MPC859TVR133A
Manufacturer:
Freescale Semiconductor
Quantity:
10 000
Thermal Calculation and Measurement
7.5
To determine the junction temperature of the device in the application after prototypes are available, the thermal
characterization parameter (Ψ
temperature at the top center of the package case using the following equation:
where:
The thermal characterization parameter is measured per JESD51-2 specification published by JEDEC using a 40
gauge type T thermocouple epoxied to the top center of the package case. The thermocouple should be positioned
so that the thermocouple junction rests on the package. A small amount of epoxy is placed over the thermocouple
junction and over about 1 mm of wire extending from the junction. The thermocouple wire is placed flat against the
package case to avoid measurement errors caused by cooling effects of the thermocouple wire.
7.6
Semiconductor Equipment and Materials International(415) 964-5111
805 East Middlefield Rd.
Mountain View, CA 94043
MIL-SPEC and EIA/JESD (JEDEC) specifications800-854-7179 or
(Available from Global Engineering Documents)303-397-7956
JEDEC Specifications http://www.jedec.org
1. C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an Automotive Engine
Controller Module,” Proceedings of SemiTherm, San Diego, 1998, pp. 47-54.
2. B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and Its
Application in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212-220.
14
T
Experimental Determination
References
J
= T
Ψ
T
P
D
T
JT
T
= thermocouple temperature on top of package
= power dissipation in package
+(Ψ
= thermal characterization parameter
JT
x P
D
)
JT
) can be used to determine the junction temperature with a measurement of the
MPC866/MPC859 Hardware Specifications, Rev. 2
Freescale Semiconductor

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