EP2S60F1020C4 Altera, EP2S60F1020C4 Datasheet - Page 127
EP2S60F1020C4
Manufacturer Part Number
EP2S60F1020C4
Description
IC STRATIX II FPGA 60K 1020-FBGA
Manufacturer
Altera
Series
Stratix® IIr
Datasheet
1.EP2S15F484I4N.pdf
(238 pages)
Specifications of EP2S60F1020C4
Number Of Logic Elements/cells
60440
Number Of Labs/clbs
3022
Total Ram Bits
2544192
Number Of I /o
718
Voltage - Supply
1.15 V ~ 1.25 V
Mounting Type
Surface Mount
Operating Temperature
0°C ~ 85°C
Package / Case
1020-FBGA
For Use With
544-1700 - DSP KIT W/STRATIX II EP2S60N544-1697 - NIOS II KIT W/STRATIX II EP2S60N
Lead Free Status / RoHS Status
Contains lead / RoHS non-compliant
Number Of Gates
-
Other names
544-1131
EP2S60F1020C4ES
EP2S60F1020C4ES
Available stocks
Company
Part Number
Manufacturer
Quantity
Price
Company:
Part Number:
EP2S60F1020C4
Manufacturer:
ALTERA
Quantity:
1 238
Company:
Part Number:
EP2S60F1020C4
Manufacturer:
ALTERA
Quantity:
3 000
Company:
Part Number:
EP2S60F1020C4N
Manufacturer:
ALTERA
Quantity:
3
Part Number:
EP2S60F1020C4N
Manufacturer:
ALTERA/阿尔特拉
Quantity:
20 000
Figure 3–2. Temperature vs. Temperature-Sensing Diode Voltage
Automated
Single Event
Upset (SEU)
Detection
Altera Corporation
May 2007
(Across Diode)
Voltage
0.95
0.90
0.85
0.80
0.75
0.70
0.65
0.60
0.55
0.50
0.45
0.40
–55
The temperature-sensing diode works for the entire operating range, as
shown in
The temperature sensing diode is a very sensitive circuit which can be
influenced by noise coupled from other traces on the board, and possibly
within the device package itself, depending on device usage. The
interfacing device registers temperature based on milivolts of difference
as seen at the TSD. Switching I/O near the TSD pins can affect the
temperature reading. Altera recommends you take temperature readings
during periods of no activity in the device (for example, standby mode
where no clocks are toggling in the device), such as when the nearby I/Os
are at a DC state, and disable clock networks in the device.
Stratix II devices offer on-chip circuitry for automated checking of single
event upset (SEU) detection. Some applications that require the device to
operate error free at high elevations or in close proximity to Earth’s North
or South Pole require periodic checks to ensure continued data integrity.
The error detection cyclic redundancy check (CRC) feature controlled by
–30
Figure
3–2.
–5
Temperature (˚C)
20
45
Stratix II Device Handbook, Volume 1
70
100 μA Bias Current
10 μA Bias Current
Configuration & Testing
95
120
3–13