GCM32DR72A225KA64L Murata Electronics, GCM32DR72A225KA64L Datasheet - Page 19

• Manufacturer Part Number: GCM32DR72A225KA64L
• Manufacturer: Murata Electronics

!Note
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!Note
*1: The figure indicates typical inspection. Please refer to individual specifications.
*2: Some of the parts are applicable in rated voltage x 150%. Please refer to individual specifications.
Table A
No.
21
Note 1: Nominal values denote the temperature coefficient within a range of 25°C to 125°C (for 5C).
GCM Series Specification and Test Methods
Continued from the preceding page.
Capacitance
Temperature
Character-
istics
Char.
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• This catalog has only typical specifications because there is no space for detailed specifications. Therefore, please approve our product specifications or transact the approval sheet for product specifications before ordering.
5C
AEC-Q200
Test Item
Capacitance
Change
Temperature
Coefficient
Capacitance
Drift
Nominal Values (ppm/°C) Note1
Temperature Compensating Type
Within the specified tolerance
(Table A)
Within the specified tolerance
(Table A)
Within ±0.2% or ±0.05 pF
(Whichever is larger)
* Do not apply to 1X/25V
0T30
Specifications
Max.
0.58
C7: Within ±22%
(-55°C to +125°C)
R7: Within ±15%
(-55°C to +125°C)
High Dielectric Type
-55
-0.24
Min.
Capacitance Change from 25°C (%)
The capacitance change should be measured after 5 min. at
each specified temperature stage.
(1) Temperature Compensating Type
(2) High Dielectric Constant Type
Specifications and Test Methods
Max.
0.40
The temperature coefficient is determined using the capacitance
measured in step 3 as a reference. When cycling the
temperature sequentially from step1 through 5 (∆C: +25°C to
+125°C: other temp. coeffs.: +25°C to +85°C) the capacitance
should be within the specified tolerance for the temperature
coefficient and capacitance change as shown in Table A. The
capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in steps
1, 3 and 5 by the capacitance value in step 3.
The ranges of capacitance change compared with the above
25°C value over the temperature ranges shown in the table
should be within the specified ranges.
· Initial measurement for high dielectric constant type.
Perform a heat treatment at 150+0/-10°C for one hour and then
set for 24±2 hours at room temperature.
Perform the initial measurement.
Step
1
2
3
4
5
-30
-0.17
Min.
AEC-Q200 Test Method
Temperature (°C)
125±3
-55±3
25±2
25±2
25±2
Max.
0.25
-10
-0.11
Min.
C03E.pdf
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09.3.31
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