GCIXP1240AB 837151 Intel, GCIXP1240AB 837151 Datasheet - Page 42
GCIXP1240AB 837151
Manufacturer Part Number
GCIXP1240AB 837151
Description
Manufacturer
Intel
Datasheet
1.GCIXP1240AB_837151.pdf
(146 pages)
Specifications of GCIXP1240AB 837151
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Intel
3.3.9
3.3.10
42
Table 20. IEEE 1149.1 Interface Pins
Table 21. Miscellaneous Test Pins
®
IXP1240 Network Processor
IEEE 1149.1 Interface Pins
Miscellaneous Test Pins
TCK
TMS
TDI
TDO
TRST_L
Totals:
SCAN_EN
TCK_BYP
TSTCLK
Totals:
Support Signal
Interface Pin
IEEE 1149.1
Processor
Names
Name
C22
C5
A23
B22
D21
B23
D6
B5
Pin #
Pin #
I1
I1
I1
O1
I1
I1
I1
I1
Type
Type
1
1
1
1
1
5
1
1
1
3
Total
Total
Test Interface reference clock. This clock times all the transfers
on the IEEE 1149.1 test interface.
Test Interface mode select. Causes state transitions on the test
access port (TAP) controller.
Test Interface data input. The serial input through which IEEE
1149.1 instructions and test data enter the IEEE 1149.1 interface.
Test Interface data output. The serial output through which test
instruction and data from the test logic leave the IXP1240.
Test Interface RESET. When asserted low, the TAP controller is
asynchronously forced to enter a reset state, and disables the
IEEE 1149.1 port. This pin must be driven or held low to achieve
normal device operation.
Used for Intel test purposes only. Enables internal scan chains for
chip testing. This pin should be connected to VSS through a
pulldown resistor.
Used for Intel test purposes only. When high, bypasses PLL for
Test/debug. Must be low for normal system operation.
Used for Intel test purposes only. Used as clock input when
bypassing the internal PLL clock generator. For Normal
operation, this pin should not be allowed to float. It should be
pulled up or pulled down through the proper value resistor.
Pin Descriptions
Pin Description
Datasheet
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