LTC2418CGN#TRPBF Linear Technology, LTC2418CGN#TRPBF Datasheet - Page 23
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LTC2418CGN#TRPBF
Manufacturer Part Number
LTC2418CGN#TRPBF
Description
IC ADC 24BIT DIFF INPUT 28SSOP
Manufacturer
Linear Technology
Datasheet
1.LTC2418CGNPBF.pdf
(48 pages)
Specifications of LTC2418CGN#TRPBF
Number Of Bits
24
Sampling Rate (per Second)
7.5
Data Interface
MICROWIRE™, Serial, SPI™
Number Of Converters
1
Power Dissipation (max)
1mW
Voltage Supply Source
Single Supply
Operating Temperature
0°C ~ 70°C
Mounting Type
Surface Mount
Package / Case
28-SSOP (0.150", 3.95mm Width)
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Available stocks
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Part Number
Manufacturer
Quantity
Price
APPLICATIO S I FOR ATIO
Whenever SCK is LOW, the LTC2414/LTC2418’s internal
pull-up at pin SCK is disabled. Normally, SCK is not exter-
nally driven if the device is in the internal SCK timing mode.
However, certain applications may require an external
driver on SCK. If this driver goes Hi-Z after outputting a LOW
signal, the LTC2414/LTC2418’s internal pull-up remains
disabled. Hence, SCK remains LOW. On the next falling
edge of CS, the device is switched to the external SCK timing
mode. By adding an external 10k pull-up resistor to SCK,
this pin goes HIGH once the external driver goes Hi-Z. On
the next CS falling edge, the device will remain in the in-
ternal SCK timing mode.
A similar situation may occur during the sleep state when
CS is pulsed HIGH-LOW-HIGH in order to test the conver-
sion status. If the device is in the sleep state (EOC = 0),
SCK will go LOW. Once CS goes HIGH (within the time
period defined above as t
activated. For a heavy capacitive load on the SCK pin, the
internal pull-up may not be adequate to return SCK to a
HIGH level before CS goes low again. This is not a concern
under normal conditions where CS remains LOW after
(INTERNAL)
SDO
SCK
SLEEP
SDI
CS
Hi-Z
> t
OUTPUT
DATA
EOCtest
BIT 0
EOC
U
CONVERSION
Hi-Z
DON’T CARE
TEST EOC
U
EOCtest
Hi-Z
SLEEP
(OPTIONAL)
TEST EOC
Figure 9. Internal Serial Clock, Reduced Data Output Length
), the internal pull-up is
SLEEP
Hi-Z
W
<t
EOCtest
(1)
BIT 31
EOC
BIT 30
REFERENCE
0.1V TO V
U
ANALOG
INPUTS
VOLTAGE
(0)
1µF
2.7V TO 5.5V
CC
BIT 29
•
•
•
•
•
•
SIG
11
12
21
28
10
9
1
8
EN
V
REF
REF
CH0
CH7
CH8
CH15
COM
CC
•
•
•
•
•
•
LTC2414/
LTC2418
+
–
BIT 28
MSB
SGL
detecting EOC = 0. This situation is easily overcome by
adding an external 10k pull-up resistor to the SCK pin.
Internal Serial Clock, 3-Wire I/O,
Continuous Conversion
This timing mode uses a 3-wire interface. The conversion
result is shifted out of the device by an internally generated
serial clock (SCK) signal, see Figure 10. CS may be perma-
nently tied to ground, simplifying the user interface or
isolation barrier.
The internal serial clock mode is selected at the end of the
power-on reset (POR) cycle. The POR cycle is concluded
approximately 1ms after V
pull-up is active during the POR cycle; therefore, the
internal serial clock timing mode is automatically selected
if SCK is not externally driven LOW (if SCK is loaded such
that the internal pull-up cannot pull the pin HIGH, the
external SCK mode will be selected).
During the conversion, the SCK and the serial data output
pin (SDO) are HIGH (EOC = 1). Once the conversion is
SDO
GND
SCK
SDI
CS
F
O
17
15
18
19
20
BIT 27
16
ODD/
SIGN
DATA OUTPUT
4-WIRE
SPI INTERFACE
V
BIT 26
CC
= 50Hz REJECTION
= EXTERNAL OSCILLATOR
= 60Hz REJECTION
A2
BIT 25
A1
LTC2414/LTC2418
BIT 24
A0
CC
V
CC
exceeds 2V. An internal weak
10k
BIT 8
DON’T CARE
CONVERSION
Hi-Z
TEST EOC
23
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2411 F09