5962-87664012A QP SEMICONDUCTOR, 5962-87664012A Datasheet - Page 6

• Manufacturer Part Number: 5962-87664012A
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-87664012A

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
Positive input
Negative input
High level input
Low level input
High level output
Low level output
Input leakage
Input leakage
See footnotes at end of table.
clamp voltage
3022
clamp voltage
3022
voltage
voltage
voltage
3006
voltage
3007
current high
3010
current low
3009
test method 1/
MIL-STD-883
Test and
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
Symbol
V
V
V
V
V
V
I
5/
5/
6/
6/
I
IH
OH
OL
IL
IH
IC+
IL
IC-
For input under test, I
For input under test, I
V
I
V
I
V
I
V
I
V
I
V
For input under test, V
For all other inputs V
GND
For input under test, V
For all other inputs V
GND
OH
OH
OH
OL
OL
I
IN
IN
IN
IN
IN
IN
OL
= 50 μA
= 24 mA
= -50 μA
= -24 mA
= -50 mA
= V
= V
= V
= V
= V
= V
= 50 mA
TABLE I. Electrical performance characteristics.
unless otherwise specified
+4.5 V ≤ V
Test conditions 2/,3/
-55°C ≤ T
IH
IH
IH
IH
IH
IH
or V
or V
or V
or V
or V
or V
IL
IL
IL
IL
IL
IL
C
CC
≤ +125°C
≤ +5.5 V
IN
IN
IN
IN
IN
IN
= V
= V
= 1.0 mA
= -1.0 mA
= 5.5 V
= 0.0 V
CC
CC
or
or
SIZE
A
Device
Device
class
type
and
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
All
V
V
REVISION LEVEL
Open
0.0 V
4.5 V
5.5 V
4.5 V
5.5 V
4.5 V
5.5 V
4.5 V
5.5 V
5.5 V
4.5 V
5.5 V
4.5 V
5.5 V
5.5 V
5.5 V
5.5 V
V
CC
C
subgroups
Group A
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1, 2, 3
1
1
3.85
-0.4
Min
0.4
2.0
2.0
4.4
5.4
3.7
4.7
Limits 4/
SHEET
5962-87664
1.65
Max
-1.5
-1.0
1.5
0.8
0.8
0.1
0.1
0.5
0.5
1.0
6
Unit
μA
μA
V
V
V
V
V
V