5962-9206203MXA QP SEMICONDUCTOR, 5962-9206203MXA Datasheet - Page 12

• Manufacturer Part Number: 5962-9206203MXA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-9206203MXA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-
883.
(see 3.5 herein).
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
c.
d.
e.
f.
a.
b.
c.
a.
b.
(1) Testing all devices submitted for test using additional built-in test circuitry which allows the manufacturer to verify
(2) If such compliance cannot be tested on an unprogrammed device, all samples submitted for testing shall be
For device class M, subgroups 7, 8A, and 8B tests shall be sufficient to verify the truth table. For device classes Q and
Devices shall be tested for programmability and ac performance compliance to the requirements of Group A, subgroups
O/V (latch-up) tests shall be measured only for initial qualification and after any design or process changes which may
Subgroup 4 (C IN and C OUT measurements) shall be measured only for initial qualification and after any process or
Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control and
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
End-point electrical parameters shall be as specified in table IIA herein.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at
T
DEFENSE SUPPLY CENTER COLUMBUS
V, subgroups 7, 8A, and 8B shall include verifying the functionality of the device, these tests shall have been fault
graded in accordance with MIL-STD-883, test method 5012 (see 1.5 herein).
9, 10, and 11. Either of two techniques is acceptable:
affect the performance of the device. For device class M, procedures and circuits shall be maintained under document
revision level control by the manufacturer and shall be made available to the preparing activity or acquiring activity upon
request. For device classes Q and V, the procedures and circuits shall be under the control of the device
manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the preparing activity or
acquiring activity upon request. Testing shall be on all pins, on five devices with zero failures. Latch-up test shall be
considered destructive. Information contained in JEDEC Standard EIA/JESD78 may be used for reference.
design changes which may affect input or output capacitance. Capacitance shall be measured between the designated
terminal and GND at a frequency of 1 MHz. Sample size is 15 devices with no failures, and all input and output
terminals tested.
shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005.
A
A
programmability and ac performance without programming the user array. If this is done, the resulting test patterns
shall be verified on all devices during subgroups 9, 10, and 11, group A testing per the sampling plan specified in
MIL-STD-883, method 5005.
programmed in accordance with 3.2.4.1 or 3.2.4.2 as applicable. After completion of all testing, the devices shall be
erased and verified except devices submitted to groups C and D testing.
= +125°C, minimum.
= +25°C ± 5°C, after exposure, to the subgroups specified in table IIA herein.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
B
SHEET
5962-92062
12