5962-8948403M3A QP SEMICONDUCTOR, 5962-8948403M3A Datasheet - Page 5

• Manufacturer Part Number: 5962-8948403M3A
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8948403M3A

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and
herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
herein) involving devices acquired to this drawing is required for any change that affects this drawing.
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
microcircuit group number 42 (see MIL-PRF-38535, appendix A).
result in a wide variety of configurations, two processing options are provided for selection in the contract using an altered
item drawing.
and table I. It is recommended that users perform subgroups 7 and 9 after programming to verify the specific program
configuration.
provisions herein, including the requirements of the altered item drawing, shall be satisfied by the manufacturer prior to
delivery.
characteristics specified in 4.5 herein.
pattern or cleared. As a minimum, verification shall consist of performing a functional test (subgroup 7) to verify that all
bits are in the proper state. Any bit that does not verify to be in the proper state shall constitute a device failure and the
device shall be removed from the lot or sample.
reprogrammability test shall be done only for initial characterization and after any design or process changes which may
affect the reprogrammability of the device. The methods and procedures may be vendor specific, but will guarantee the
number of program/erase endurance cycles listed in section 1.3 herein over the full military temperature range. The
vendor's procedure shall be kept under document control and shall be made available upon request.
be done initially and after any design or process change which may affect data retention. The methods and procedures may be
vendor specific, but will guarantee the number of years listed in section 1.3 herein over the full military temperature range. The
vendor's procedure shall be kept under document control and shall be made available upon request.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the
3.11 Processing options. Since the device is capable of being programmed by either the manufacturer or the user to
3.11.1 Unprogrammed device delivered to the user. All testing shall be verified through group A testing as defined in 3.2.3.1
3.11.2 Manufacturer-programmed device delivered to the user. All testing requirements and quality assurance
3.12 Erasure of UVEPROMS. When specified, devices shall be erased in accordance with the procedures and
3.13 Verification of state of UVEPROMs. When specified, devices shall be verified as either written to the specified
3.14 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This
3.15 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test shall
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
A
SHEET
5962-89484
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