5962-8851806LA QP SEMICONDUCTOR, 5962-8851806LA Datasheet - Page 9

• Manufacturer Part Number: 5962-8851806LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8851806LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
Note: Transition is measured at steady state high level -500 mV or steady state low level +500 mV on the output from the
1.5 V level on the input with loads shown on figure 4; CL = 5 pF.
DEFENSE SUPPLY CENTER COLUMBUS
NOTES:
1.
2.
3.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
C
for t
Tests are performed with rise and fall times of 5 ns or less.
All device test loads should be located within two inches of device outputs.
L
includes probe and jig capacitance. C
HZC
and t
STANDARD
HZE
.
FIGURE 4. Output load circuit and test conditions.
FIGURE 5. Switching waveforms.
L
= 50 pF for all switching characteristics except t
SIZE
A
REVISION LEVEL
D
HZC
SHEET
and t
5962-88518
HZE
. C
9
L
= 5 pF