5962-8851806LA QP SEMICONDUCTOR, 5962-8851806LA Datasheet - Page 4

• Manufacturer Part Number: 5962-8851806LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8851806LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
specified in table I and shall apply over the full case operating temperature range.
tests for each subgroup are described in table I.
in 1.2 herein. In addition, the manufacturer's PIN may also be marked. For packages where marking of the entire SMD PIN
number is not feasible due to space limitations, the manufacturer has the option of not marking the "5962-" on the device.
MIL-PRF-38535, appendix A. The compliance indicator “C” shall be replaced with a "Q" or "QML" certification mark in
accordance with MIL-PRF-38535 to identify when the QML flow option is used.
approved source of supply in MIL-HDBK-103 (see 6.6 herein). The certificate of compliance submitted to DSCC-VA prior to
listing as an approved source of supply shall affirm that the manufacturer's product meets the requirements of MIL-PRF-38535,
appendix A and the requirements herein.
each lot of microcircuits delivered to this drawing.
facility and applicable required documentation. Offshore documentation shall be made available onshore at the option of the
reviewer.
be done initially and after any design or process change which may affect data retention. The methods and procedures may be
vendor specific, but will guarantee the number of years listed in section 1.3 herein over the full military temperature range. The
vendor's procedure shall be kept under document control and shall be made available upon request.
appendix A.
prior to quality conformance inspection. The following additional criteria shall apply:
3.3 Electrical performance characteristics. Unless otherwise specified herein, the electrical performance characteristics are as
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
3.5 Marking. Marking shall be in accordance with MIL-PRF-38535, appendix A. The part shall be marked with the PIN listed
3.5.1 Certification/compliance mark. A compliance indicator “C” shall be marked on all non-JAN devices built in compliance to
3.6 Certificate of compliance. A certificate of compliance shall be required from a manufacturer in order to be listed as an
3.7 Certificate of conformance. A certificate of conformance as required in MIL-PRF-38535, appendix A shall be provided with
3.8 Notification of change. Notification of change to DSCC-VA shall be required for any change that affects this drawing.
3.9 Verification and review. DSCC, DSCC's agent, and the acquiring activity retain the option to review the manufacturer's
3.10 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test shall
4. VERIFICATION
4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535,
4.2 Screening. Screening shall be in accordance with method 5004 of MIL-STD-883, and shall be conducted on all devices
a. Burn-in test, method 1015 of MIL-STD-883.
b. Interim and final electrical test parameters shall be as specified in table II herein, except interim electrical parameter tests
(1)
(2) T
prior to burn-in are optional at the discretion of the manufacturer.
DEFENSE SUPPLY CENTER COLUMBUS
Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level control
and shall be made available to the preparing activity upon request. The test circuit shall specify the inputs, outputs,
biases, and power dissipation, as applicable, in accordance with the intent specified in method 1015 of MIL-STD-883.
A
MICROCIRCUIT DRAWING
= +125°C, minimum.
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
D
SHEET
5962-88518
4