5962-8851806LA QP SEMICONDUCTOR, 5962-8851806LA Datasheet - Page 11

• Manufacturer Part Number: 5962-8851806LA
• Manufacturer: QP SEMICONDUCTOR

Specifications of 5962-8851806LA

• Lead Free Status / RoHS Status: Supplier Unconfirmed

DSCC FORM 2234
APR 97
made available upon request.
(original equipment), design applications, and logistics purposes.
specification or drawing.
individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
application requires configuration control and the applicable SMD. DSCC will maintain a record of users and this list will be used
for coordination and distribution of changes to the drawings. Users of drawings covering microelectronics devices (FSC 5962)
should contact DSCC-VA, telephone [phone].
692-0547.
103 have agreed to this drawing and a certificate of compliance (see 3.6 herein) has been submitted to and accepted by DSCC-
VA.
4.3.2 Groups C and D inspections.
4.4 Programming procedures. The programming procedures shall be as specified by the device manufacturer and shall be
5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535, appendix A.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
6.2 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor-prepared
6.3 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for the
6.4 Record of users. Military and industrial users shall inform Defense Supply Center Columbus (DSCC) when a system
6.5 Comments. Comments on this drawing should be directed to DSCC-VA, Columbus, Ohio 43218-3990, or telephone (614)
6.6 Approved sources of supply. Approved sources of supply are listed in MIL-HDBK-103. The vendors listed in MIL-HDBK-
a.
b.
c.
(1)
(2)
(3)
End-point electrical parameters shall be as specified in table II herein.
Steady-state life test conditions, method 1005 of MIL-STD-883.
For quality conformance inspection, the programmability sample (see 4.3.1d) shall be included in subgroup 1 test.
DEFENSE SUPPLY CENTER COLUMBUS
and shall be made available to the preparing activity upon request. The test circuit shall specify the inputs, outputs,
biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-883.
Test condition C or D. The test circuit shall be maintained by the manufacturer under document revision level control
TA = +125°C, minimum.
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
D
SHEET
5962-88518
11