5962-9174402MXA QP SEMICONDUCTOR, 5962-9174402MXA Datasheet - Page 7

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5962-9174402MXA

Manufacturer Part Number
5962-9174402MXA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of 5962-9174402MXA

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DSCC FORM 2234
APR 97
1/
2/
3/
4/
5/
6/
7/
8/
9/
Address pulse width
Address setup to clock
Address hold time from
Output valid from clock
Clock pulse width
Output low Z from
Output high Z from
Output low Z from E
Output high Z from E
E
E
high
clock high
high 3/
high 3/
high 3/
clock high 4/, 7/
clock high 4/, 7/, 9/
low 4/, 8/
high 4/, 8/, 9/
S
S
setup to clock
hold from clock
These are absolute values with respect to device ground and all overshoots and undershoots due to system or tester noise
are included.
For devices using the synchronous enable, the device must be clocked after applying these voltages to perform this
For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 1
second. V
Tested initially and after any design or process changes that affect that parameter, and therefore shall be guaranteed to the
limits specified in table I.
At f = f
AC tests are performed with input rise and fall times of 5 ns or less, timing reference levels of 1.5 V, input pulse levels of 0 to
3.0 V, and the output load on figure 3.
Applies only when the synchronous E s function is used.
Applies only when the synchronous E function is used.
Transition is measured at steady-state high level -500 mV or steady-state low level +500 mV on the output from the 1.5 V
level on the input, C
measurement.
DEFENSE SUPPLY CENTER COLUMBUS
max
Test
MICROCIRCUIT DRAWING
, address inputs are cycling at the maximum frequency of 1/t
COLUMBUS, OHIO 43218-3990
OUT
= 0.5 V has been chosen to avoid test problems caused by tester ground degradation.
STANDARD
L
= 5 pF (including scope and jig). See figure 3.
t
t
t
t
t
t
t
t
t
t
t
Symbol
LL
SA
HA
SES
HES
CO
PWC
LZC
HZC
LZE
HZE
TABLE I. Electrical performance characteristics – Continued.
See figures 3 and 4 and 6/
unless otherwise specified
-55°C ≤ T
4.5 V ≤ V
Conditions
C
CC
≤ +125°C
≤ 5.5 V
SIZE
A
SA
subgroups
9, 10, 11
Group A
REVISION LEVEL
Device
type
01
02
01
All
All
All
01
02
All
01
02
01
02
01
02
01
02
02
B
Min
15
10
50
40
15
10
20
0
Limits
Max
SHEET
25
20
30
20
30
20
30
20
30
20
5962-91744
7
Unit
ns

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