5962-9174402MXA QP SEMICONDUCTOR, 5962-9174402MXA Datasheet - Page 12

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5962-9174402MXA

Manufacturer Part Number
5962-9174402MXA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of 5962-9174402MXA

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DSCC FORM 2234
APR 97
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-STD-
883.
(see 3.5 herein).
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.2.1 Additional criteria for device class M. Steady-state life test conditions, method 1005 of MIL-STD-883:
4.4.2.2 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table IIA herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
4.4.1 Group A inspection.
a.
b.
c.
a.
b.
a.
b. Subgroups 5 and 6 in table I, method
c.
d.
e. O/V (latch-up) tests shall be measured only for initial qualification and after any design or process changes which may
f.
DEFENSE SUPPLY CENTER COLUMBUS
affect the performance of the device. For device class M, procedures and circuits shall be maintained under document
revision level control by the manufacturer and shall be made available to the preparing activity or acquiring activity upon
request. For device classes Q and V, the procedures and circuits shall be under the control of the device
manufacturer's TRB in accordance with MIL-PRF-38535 and shall be made available to the preparing activity or
acquiring activity upon request. Testing shall be on all pins, on five devices with zero failures. Latch-up test shall be
considered destructive. Information contained in JEDEC Standard EIA/JESD 78 may be used for reference.
testing, the devices shall be erased and verified except devices being submitted to groups B, C, and D testing.
Test condition D. The test circuit shall be maintained by the manufacturer under document revision level control and
shall be made available to the preparing or acquiring activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-
STD-883.
T
Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
Subgroup 4 (C
changes which may affect capacitance. Capacitance shall be measured between the designated terminal and GND at
a frequency of 1 MHz. Sample size is 15 devices with no failures, and all input and output terminals tested.
All devices selected for testing shall be programmed with a checkerboard pattern, or equivalent. After completion of all
End-point electrical parameters shall be as specified in table IIA herein.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. For device class M, the devices shall be subjected to
radiation hardness assured tests as specified in MIL-PRF-38535, appendix A for the RHA level being tested. All device
classes must meet the postirradiation end-point electrical parameter limits as defined in table I at T
after exposure, to the subgroups specified in table IIA herein.
Tests shall be as specified in table IIA herein.
For device class M, subgroups 7 and 8 tests shall be sufficient to verify the truth table. For device classes Q and V,
subgroups 7 and 8 shall include verifying the functionality of the device.
A
= +125°C, minimum.
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
IN
and C
OUT
measurements) shall be measured only for the initial test and after process or design
SIZE
A
REVISION LEVEL
B
A
= +25°C ±5°C,
SHEET
5962-91744
12

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