5962-9174402MXA QP SEMICONDUCTOR, 5962-9174402MXA Datasheet - Page 5

no-image

5962-9174402MXA

Manufacturer Part Number
5962-9174402MXA
Description
Manufacturer
QP SEMICONDUCTOR
Datasheet

Specifications of 5962-9174402MXA

Lead Free Status / RoHS Status
Supplier Unconfirmed

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
5962-9174402MXA
Manufacturer:
CY
Quantity:
8
Part Number:
5962-9174402MXA
Manufacturer:
CYP
Quantity:
38
DSCC FORM 2234
APR 97
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). For device class M, a certificate of
compliance shall be required from a manufacturer in order to be listed as an approved source of supply in MIL-HDBK-103 (see
6.6.2 herein). The certificate of compliance submitted to DSCC-VA prior to listing as an approved source of supply for this
drawing shall affirm that the manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and
herein or for device class M, the requirements of MIL-PRF-38535, appendix A and herein.
device class M in MIL-PRF-38535, appendix A shall be provided with each lot of microcircuits delivered to this drawing.
herein) involving devices acquired to this drawing is required for any change that affects this drawing.
option to review the manufacturer's facility and applicable required documentation. Offshore documentation shall be made
available onshore at the option of the reviewer.
microcircuit group number 42 (see MIL-PRF-38535, appendix A).
manufacturer prior to delivery.
specified by the manufacturer.
procedures and characteristics specified by the manufacturer.
specified program, or erased. As a minimum, verification shall consist of performing a functional test (subgroup 7) to verify that
all bits are in the proper state. Any bit that does not verify to be in the proper state shall constitute a device failure, and shall be
removed from the lot.
be done for initial characterization and after any design or process change which may affect data retention. The methods and
procedures may be vendor specific, but shall guarantee the number of years listed in section 1.3 herein over the full military
temperature range. The vendor's procedure shall be kept under document control and shall be made available upon request of
the acquiring or preparing activity, along with test data.
done for initial characterization and after any design or process change which may affect the reprogrammability of the device.
The methods and procedures may be vendor specific, but shall guarantee the number of program/erase endurance cycles listed
in section 1.3 herein over the full military temperature range. The vendor's procedure shall be kept under document control and
shall be made available upon request of the acquiring or preparing activity, along with test data.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 or for
3.8 Notification of change for device class M. For device class M, notification to DSCC-VA of change of product (see 6.2
3.9 Verification and review for device class M. For device class M, DSCC, DSCC's agent, and the acquiring activity retain the
3.11 Processing EPROMS. All testing requirements and quality assurance provisions herein, shall be satisfied by the
3.11.1 Erasure of EPROMS. When specified, devices shall be erased in accordance with the procedures and characteristics
3.11.2 Programmability of EPROMS. When specified, devices shall be programmed to the specified pattern using the
3.11.3 Verification of programmed or erased EPROMs. When specified, devices shall be verified as either programmed to a
3.12 Data retention. A data retention stress test shall be completed as part of the vendor's reliability monitors. This test shall
3.13 Endurance. A reprogrammability test shall be completed as part of the vendor's reliability monitors. This test shall be
3.10 Microcircuit group assignment for device class M. Device class M devices covered by this drawing shall be in
DEFENSE SUPPLY CENTER COLUMBUS
MICROCIRCUIT DRAWING
COLUMBUS, OHIO 43218-3990
STANDARD
SIZE
A
REVISION LEVEL
B
SHEET
5962-91744
5

Related parts for 5962-9174402MXA