M38510/20302BEA QP SEMICONDUCTOR, M38510/20302BEA Datasheet - Page 23

• Manufacturer Part Number: M38510/20302BEA
• Manufacturer: QP SEMICONDUCTOR

Specifications of M38510/20302BEA

• Lead Free Status / RoHS Status: Not Compliant

1/ For programmed devices, select an appropriate address to acquire the desired output state, V
2/ 16 mA for circuits A, C and G.
3/ For unprogrammed devices, apply 12.0 V on pin 6 (A
4/ For unprogrammed devices, apply 13 V on pins 1 (A
5/ The functional tests shall verify that no fuses are blown for unprogrammed devices or that the truth table specified in the altered item drawing exists for
6/ For unprogrammed 02 devices (82S129); apply 10.0 V on pin 15 (A
7/ 2.4 V for circuit B devices.
T
T
Subgroup Symbol
12 mA for circuit B.
a. Inputs: H = 3.0 V, L = GND
b. Outputs: Output voltage shall be either:
c. The functional tests shall be performed with V
programmed devices (see 3.3.2). All bits shall be tested. Terminal conditions shall be as follows:
unprogrammed 04 devices (82S129A) apply 10.0 V on pin 5 (A
C
C
=+25°C
=+25°C
10
11
1. H = 2.4 V minimum and L = 0.5 V maximum when using a high speed checker double comparator, or
2. H ≥ 1.0 V and L ≤ 1.0 V when using a high speed checker single comparator.
2
3
7
8
9
Same tests, terminal conditions, and limits as for subgroup 1, except T
Same tests, terminal conditions, and limits as for subgroup 1, except T
Same tests, terminal conditions, and limits as for subgroup 7, except T
Same tests, terminal conditions, and limits as subgroup 9, except T
Same tests, terminal conditions, and limits as subgroup 9, except T
Funct-
ional
t
t
t
t
test
PHL1
PLH1
PHL2
PLH2
STD-883
GALPAT
GALPAT
Sequen-
Sequen-
method
Fig. 4
Fig. 4
Fig. 4
Fig. 4
MIL-
tial
tial
5/
Test no.
Terminal conditions Outputs: Not designated are open or resistive coupled to GND or voltage
Cases
E,F
52
53
54
55
56
10/
10/
A
5/
8/
8/
1
6
10/
10/
A
5/
8/
8/
2
5
10/
10/
A
5/
8/
8/
3
4
Inputs: Not designated are high ≥ 2.0 V, low ≤ 0.8 V, or open.
CC
10/
10/
A
5/
8/
8/
4
TABLE III. Group A inspection for device type 02, 04.
3
= 4.5 V and V
C
C
6
= +125°C.
1
= -55°C.
) and 2 (A
) for circuit B devices.
C
C
C
= +125°C and V
= -55°C and V
= +125°C and -55°C.
10/
10/
A
5/
8/
8/
5
0
5
10/
10/
0
A
5/
8/
8/
) for circuit A devices.
6
) and 5.0 V on all other address pins for the circuit C devices.
1
IC
CC
IC
tests are omitted.
7
tests are omitted.
= 5.5 V.
), apply 0.5 V on pin 2 (A
10/
10/
A
5/
8/
8/
7
2
GND
GND
GND
8
“
“
“
O
5/
9/
9
“
“
“
4
10
O
5/
9/
“
“
“
3
5
IL
) and 5.0 V on all other address lines for circuit C devices. For
= 0.8 V, V
11
O
5/
9/
“
“
“
2
12
O
5/
9/
“
“
“
1
IH
= 2.0 V.
GND
GND
CE
10/
10/
13
5/
1
GND
GND
CE
10/
10/
14
5/
2
10/
10/
15
A
5/
8/
8/
7
V
10/
10/
16
5/
8/
8/
CC
Measured
terminal
Outputs
Outputs
“
“
“
.
Min
Test limits
Max
11/
5/
“
“
“
Unit
ns
“
“
“