SCAN90CP02SPX National Semiconductor, SCAN90CP02SPX Datasheet - Page 12

• Manufacturer Part Number: SCAN90CP02SPX
• Manufacturer: National Semiconductor

Specifications of SCAN90CP02SPX

• Array Configuration: 2x2
• Number Of Arrays: 1
• Differential Data Transmission: Yes
• Power Supply Requirement: Single
• Operating Supply Voltage (typ): 3.3V
• Package Type: LLP EP
• Pin Count: 28
• Mounting: Surface Mount
• Operating Temperature (max): 85C
• Operating Temperature (min): -40C
• Operating Temperature Classification: Industrial
• Cascading Capability: No
• On-chip Buffers: No
• On-chip Decoder: No
• On-chip Latch Circuit: No
• On-chip Mux/demux: No
• Programmable: No
• Operating Supply Voltage (max): 3.6V
• Operating Supply Voltage (min): 3V
• Dual Supply Voltage (typ): Not RequiredV
• Dual Supply Voltage (max): Not RequiredV
• Dual Supply Voltage (min): Not RequiredV
• Output Level: LVDS
• Lead Free Status / RoHS Status: Not Compliant

Design-For-Test (DfT) Features
IEEE 1149.1 SUPPORT
The SCAN90CP02 supports a fully compliant IEEE 1149.1
interface. The Test Access Port (TAP) provides access to
boundary scan cells at each LVTTL I/O on the device for in-
terconnect testing. Differential pins are included in the same
boundary scan chain but instead contain IEEE1149.6 cells.
IEEE1149.6 is the improved IEEE standard for testing high-
speed differential signals.
Refer to the BSDL file located on National's website for the
details of the SCAN90CP02 IEEE 1149.1 implementation.
IEEE 1149.6 SUPPORT
AC-coupled differential interconnections on very high speed
(1+ Gbps) data paths are not testable using traditional IEEE
1149.1 techniques. The IEEE 1149.1 structures and methods
are intended to test static (DC-coupled), single ended net-
works. IEEE1149.6 is specifically designed for testing high-
speed differential, including AC coupled networks.
The SCAN90CP02 is intended for high-speed signalling up to
1.5 Gbps and includes IEEE1149.6 on all differential inputs
and outputs.
FAULT INSERTION
Fault Insertion is a technique used to assist in the verification
and debug of diagnostic software. During system testing
faults are "injected" to simulate hardware failure and thus help
verify the monitoring software can detect and diagnose these
faults. In the SCAN90004 an IEEE1149.1 "stuck-at" instruc-
tion can create a stuck-at condition, either high or low, on any
pin or combination of pins.
A more detailed description of the stuck-at feature can be
found in NSC Applications note AN-1313.
www.national.com
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