PCK2001RDB NXP Semiconductors, PCK2001RDB Datasheet - Page 5

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PCK2001RDB

Manufacturer Part Number
PCK2001RDB
Description
Clock Buffer 14.318-150 MHZ 12C 1:6 CK BUFR
Manufacturer
NXP Semiconductors
Datasheet

Specifications of PCK2001RDB

Number Of Outputs
6
Operating Supply Voltage (max)
3.465V
Operating Temp Range
0C to 70C
Propagation Delay Time
3.5ns
Operating Supply Voltage (min)
3.135V
Mounting
Surface Mount
Pin Count
16
Operating Supply Voltage (typ)
3.3V
Package Type
SSOP
Quiescent Current
100uA
Power Dissipation
850mW
Input Frequency
533MHz
Duty Cycle
55%
Operating Temperature Classification
Commercial
Max Input Freq
533 MHz
Propagation Delay (max)
2.6 ns
Supply Voltage (max)
3.465 V
Supply Voltage (min)
3.135 V
Maximum Power Dissipation
850 mW
Maximum Operating Temperature
+ 70 C
Minimum Operating Temperature
0 C
Mounting Style
SMD/SMT
Package / Case
SSOP-16
Lead Free Status / RoHS Status
Compliant
Other names
PCK2001RDB,112

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
PCK2001RDB
Manufacturer:
NXP
Quantity:
6 133
Philips Semiconductors
AC CHARACTERISTICS
NOTES:
1. Clock period and skew are measured on the rising edge at 1.5V.
2. t
3. t
4. t
5. Duty cycle should be tested with a 50/50% input.
6. Over MIN (20pF) to MAX (30pF) discrete load, process, voltage, and temperature.
7. Input edge rate for these tests must be faster than 1 V/ns.
8. Calculated at minimum edge rate (1.5ns) to guarantee 45/55% duty cycle at 1.5V. Pulsewidth is required to be wider at the faster edge to
9. All typical values are at V
10. Typical is measured with MAX (30pF) discrete load.
11. Typical is measured with MIN (20pF) discrete load.
2002 Dec 13
DUTY CYCLE
533 MHz I
ensure duty cycle specification is met.
SYMBOL
SYMBOL
H
L
SDRISE
t
t
t
SDRISE
SDFALL
DDSKW
is measured at 0.4V as shown in Figure 2.
is measured at 2.4V as shown in Figure 2.
t
t
t
SKW
PLH
PHL
t
t
t
t
t
t
t
t
t
t
t
t
H
H
H
H
P
L
P
L
P
L
P
L
and t
SDFALL
2
C 1:6 clock buffer
Buffer LH propagation delay
Buffer HL propagation delay
are measured as a transition through the threshold region V
Device to device skew
CC
Output Duty Cycle
CLK HIGH time
CLK HIGH time
CLK HIGH time
CLK HIGH time
CLK LOW time
CLK LOW time
CLK LOW time
CLK LOW time
Bus CLK skew
PARAMETER
PARAMETER
= 3.3V and T
CLK period
CLK period
CLK period
CLK period
Rise time
Fall time
amb
= 25°C.
Measured at 1.5 V
TEST CONDITIONS
100 MHz
133 MHz
33 MHz
66 MHz
5
NOTES
4, 6, 10
4, 6, 11
2, 6, 8
3, 6, 8
2, 6, 8
3, 6, 8
2, 6, 8
3, 6, 8
2, 6, 8
3, 6, 8
5, 6, 7
OL
1, 6
1, 6
1, 6
1, 6
1,6
6, 7
6, 7
= 0.4V and V
29.9
12.3
12.1
14.9
MIN
5.6
5.3
9.9
3.3
3.2
7.4
2.6
2.2
1.5
1.5
1.0
1.0
45
OH
T
amb
= 2.4V (1 mA) JEDEC specification.
= 0°C to +70°C
LIMITS
10.01
TYP
30.0
14.3
14.1
15.0
150
6.8
6.5
4.2
4.1
7.5
3.1
2.7
2.0
2.5
2.4
2.6
50
9
PCK2001R
MAX
30.2
16.3
16.1
15.2
10.2
250
500
8.0
7.7
5.1
5.0
7.7
3.6
3.2
4.0
4.0
3.5
3.5
55
Product data
UNIT
UNIT
V/ns
V/ns
ns
ns
ns
ns
ns
ns
ps
ps
%

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