BLF6G22LS-130,112 NXP Semiconductors, BLF6G22LS-130,112 Datasheet - Page 6

TRANSISTOR BASE STATION SOT502B

BLF6G22LS-130,112

Manufacturer Part Number
BLF6G22LS-130,112
Description
TRANSISTOR BASE STATION SOT502B
Manufacturer
NXP Semiconductors
Datasheet

Specifications of BLF6G22LS-130,112

Package / Case
SOT502B
Transistor Type
LDMOS
Frequency
2.11GHz
Gain
17dB
Voltage - Rated
65V
Current Rating
34A
Current - Test
1.1A
Voltage - Test
28V
Power - Output
30W
Configuration
Single
Transistor Polarity
N-Channel
Resistance Drain-source Rds (on)
0.135 Ohms
Drain-source Breakdown Voltage
65 V
Gate-source Breakdown Voltage
13 V
Continuous Drain Current
34 A
Maximum Operating Temperature
+ 225 C
Mounting Style
SMD/SMT
Minimum Operating Temperature
- 65 C
Lead Free Status / RoHS Status
Lead free / RoHS Compliant
Noise Figure
-
Lead Free Status / RoHS Status
Lead free / RoHS Compliant, Lead free / RoHS Compliant
Other names
568-4280
934060923112
BLF6G22LS-130
NXP Semiconductors
BLF6G22LS-130_1
Product data sheet
Fig 5.
(dB)
G
p
21
19
17
15
13
0
V
f
2-carrier W-CDMA power gain and drain
efficiency as functions of average load power;
typical values
2
DS
= 2167.5 MHz; carrier spacing 10 MHz.
= 28 V; I
10
7.4 2-carrier W-CDMA
Dq
= 1100 mA; f
20
30
1
= 2157.5 MHz;
40
G
001aai098
P
D
p
L
(W)
50
Rev. 01 — 23 May 2008
40
30
20
10
0
(%)
D
Fig 6.
ACPR,
IMD3
(dBc)
20
40
60
80
0
0
V
f
2-carrier W-CDMA adjacent channel leakage
ratio and IMD3 as functions of average load
power; typical values
2
DS
= 2170.05 MHz.
= 28 V; I
10
Dq
BLF6G22LS-130
= 1100 mA; f
ACPR
IMD3
20
Power LDMOS transistor
1
= 2169.95 MHz;
30
© NXP B.V. 2008. All rights reserved.
P
L(AV)
001aai102
(W)
40
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