NTMD4184PFR2G ON Semiconductor, NTMD4184PFR2G Datasheet - Page 2

• Manufacturer Part Number: NTMD4184PFR2G
• Description: MOSFET P-CH 30V 2.3A 8-SOIC
• Manufacturer: ON Semiconductor

Specifications of NTMD4184PFR2G

• Fet Type: MOSFET P-Channel, Metal Oxide
• Fet Feature: Diode (Isolated)
• Rds On (max) @ Id, Vgs: 95 mOhm @ 3A, 10V
• Drain To Source Voltage (vdss): 30V
• Current - Continuous Drain (id) @ 25° C: 2.3A
• Vgs(th) (max) @ Id: 3V @ 250µA
• Gate Charge (qg) @ Vgs: 4.2nC @ 4.5V
• Input Capacitance (ciss) @ Vds: 360pF @ 10V
• Power - Max: 770mW
• Mounting Type: Surface Mount
• Package / Case: 8-SOIC (3.9mm Width)
• Configuration: Single Dual Drain
• Transistor Polarity: P-Channel
• Resistance Drain-source Rds (on): 0.095 Ohms
• Drain-source Breakdown Voltage: - 30 V
• Gate-source Breakdown Voltage: +/- 20 V
• Continuous Drain Current: 4 A
• Power Dissipation: 2.31 W
• Maximum Operating Temperature: + 150 C
• Mounting Style: SMD/SMT
• Minimum Operating Temperature: - 55 C
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant

Update Notification #16265
Reliability Data Summary:
SO8 Device: NTMS4177PR2G
Test: High Temperature Reverse Bias (HTRB)
Conditions: Ta=150'C, Vds= 80% BVdss Rating, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: High Temperature Gate Bias (HTGB)
Conditions: Ta=150'C, Vds= 100% Vgs Rating, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: High Temperature Storage Life (HTSL)
Conditions: Ta=150'C, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: Intermittent Operating Life (IOL-PC)
Conditions: Ta=25'C, delta Tj=100'C, 2-min on/off, 15K- cy, 3-Lots
Results: 0/240
Test: Temperature Cycling (TC-PC)
Conditions: Ta=-65'C/150'C, Air-to-Air, Dwell >=10-min, 500-cy, 3-Lots
Results: 0/240
Test: Autoclave Test (AC-PC)
Conditions: Ta=121'C, P=15psi, RH=100%, Duration: 96-Hrs, 3-Lots
Results: 0/240
Test: Highly Accelerated Stress Test (HAST)
Conditions: Ta=130'C, RH=85%, Duration: 96-Hrs, 3-Lots
Results: 0/240
Schottky Die: DR0734 and DR0733
Test: High Temperature Reverse Bias (HTRB)
Conditions: Ta=150'C, Vds= 80% BVdss Rating, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: High Temperature Storage Life (HTSL)
Conditions: Ta=175'C, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: High Temperature Storage Life (HTSL)
Conditions: Ta=150'C, Duration : 1008-Hrs, 3-Lots
Results: 0/240
Test: Temperature Cycling (TC-PC)
Conditions: Ta=-65'C/150'C, Air-to-Air, Dwell >=10-min, 500-cy, 3-Lots
Results: 0/240
Test: Autoclave Test (AC-PC)
Conditions: Ta=121'C, P=15psi, RH=100%, Duration: 96-Hrs, 6-Lots
Results: 0/480
Test: Highly Accelerated Stress Test (UHAST)
Conditions: Ta=130'C, RH=85%, Duration: 96-Hrs, 3-Lots
Results: 0/240
Issue Date: 12 May 2009
Rev.07-02-06
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