1132A AGILENT TECHNOLOGIES, 1132A Datasheet - Page 13

• Manufacturer Part Number: 1132A
• Description: TEST PROBE, OSCILLOSCOPE
• Manufacturer: AGILENT TECHNOLOGIES

Specifications of 1132A

• Test Probe Type: Oscilloscope
• Test Probe Functions: High Frequency
• Accuracy: ± 3%
• For Use With: Infiniium Series Oscilliscopes
• Lead Free Status / RoHS Status: na

High-Frequency Active Differential/Single-Ended Probe System
Agilent 1130A/31A/32A/34A InfiniiMax High-Performance Active Probe System
Specifications
Operating Characteristics
Probe bandwidth*
Rise and fall time (10% to 90%)
System bandwidth (–3 dB)
Input capacitance**
Input resistance*
Input dynamic range
Input common mode range
Maximum signal slew rate
DC attenuation
Zero offset error referred
to input
Offset range*
Offset accuracy
Noise referred to input
Propagation delay
Maximum input voltage*
ESD tolerance
* Denotes warranted specifications, all others are typical.
** Measured using the probe amplifier and solder-in differential probe head with full bandwidth resistors.
1134A: > 7 GHz
1132A: > 5 GHz
1131A: > 3.5 GHz
1130A: > 1.5 GHz
1134A: 60 psec
1132A: 86 psec
1131A: 100 psec
1130A: 233 psec
1134A with 54855A: 6 GHz
1132A with 54854A: 4 GHz
1131A with 54853A: 2.5 GHz
1131A with 54852A: 2 GHz
1130A with MSO/DSO8104A, 54832B/D, 33A/D: 1 GHz
Cm = 0.1 pF Cm is between tips.
Cg = 0.34 pF Cg is to ground for each tip.
Cdiff = 0.27pF Differential mode capacitance = Cm + Cg/2
Cse = 0.44 pF Singe-ended mode capacitance = Cm + Cg
Differential mode resistance = 50 kΩ ± 1%
Single-ended mode resistance = 25 kΩ ± 1%
±2.5 V
±6.75 V dc to 100 Hz; ±1.25 V >100 Hz
18 V/ns when probing a single-ended signal
30 V/ns when probing a differential signal
10:1 ± 3% before calibration on oscilloscope
10:1 ± 1% after calibration on oscilloscope
< 30 mV before calibration on oscilloscope
< 5 mV after calibration on oscilloscope
± 12.0 V when probing single-ended
< 3 % setting before calibration on oscilloscope
< 1 % setting after calibration on oscilloscope
3.0 mVrms
~6 nsec (This delay can be deskewed relative to
other signals.)
30 Vpeak, CAT I
> 8 kV from 100 pF, 300 Ω HBM
dB
dB
Example of characterized
performance plots: differential
solder-in probe head
Figure 3.5. Common mode rejection
vs. frequency.
Figure 3.4. Swept frequency response.
-12
-10
-20
-30
-40
-50
-60
-3
-6
-9
0
6
3
0
10
10
8
8
Frequency (Hz)
Frequency (Hz)
10
10
9
9
10
10
10
10
13