SUD50N04-8M8P-4GE3 Vishay, SUD50N04-8M8P-4GE3 Datasheet - Page 2

• Manufacturer Part Number: SUD50N04-8M8P-4GE3
• Description: MOSFET N-CH 40V 50A TO-252
• Manufacturer: Vishay

Specifications of SUD50N04-8M8P-4GE3

• Fet Type: MOSFET N-Channel, Metal Oxide
• Fet Feature: Logic Level Gate
• Rds On (max) @ Id, Vgs: 8.8 mOhm @ 20A, 10V
• Drain To Source Voltage (vdss): 40V
• Current - Continuous Drain (id) @ 25° C: 50A
• Vgs(th) (max) @ Id: 3V @ 250µA
• Gate Charge (qg) @ Vgs: 56nC @ 10V
• Input Capacitance (ciss) @ Vds: 2400pF @ 20V
• Power - Max: 48.1W
• Mounting Type: Surface Mount
• Package / Case: DPak, TO-252 (2 leads+tab), SC-63
• Minimum Operating Temperature: - 55 C
• Configuration: Single
• Transistor Polarity: N-Channel
• Resistance Drain-source Rds (on): 0.0088 Ohm @ 10 V
• Drain-source Breakdown Voltage: 40 V
• Gate-source Breakdown Voltage: +/- 20 V
• Continuous Drain Current: 14 A
• Power Dissipation: 3100 mW
• Maximum Operating Temperature: + 150 C
• Mounting Style: SMD/SMT
• Drain Source Voltage Vds: 40V
• On Resistance Rds(on): 6.9mohm
• Rds(on) Test Voltage Vgs: 10V
• Operating Temperature Range: -55°C To +150°C
• Transistor Case Style: TO-252
• Rohs Compliant: Yes
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant
• Lead Free Status / RoHS Status: Lead free / RoHS Compliant, Lead free / RoHS Compliant
• Other names: SUD50N04-8M8P-4GE3TR; SUD50N04-8M8P-GE3TR; SUD50N04-8M8P-GE3TR

SUD50N04-8m8P
Vishay Siliconix
Notes:
a. Pulse test; pulse width ≤ 300 µs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
www.vishay.com
2
SPECIFICATIONS T
Parameter
Static
Drain-Source Breakdown Voltage
V
V
Gate-Source Threshold Voltage
Gate-Source Leakage
Zero Gate Voltage Drain Current
On-State Drain Current
Drain-Source On-State Resistance
Forward Transconductance
Dynamic
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
Gate Resistance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Drain-Source Body Diode Characteristics
Continuous Source-Drain Diode Current
Pulse Diode Forward Current
Body Diode Voltage
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
Reverse Recovery Fall Time
Reverse Recovery Rise Time
DS
GS(th)
Temperature Coefficient
Temperature Coefficient
b
a
a
J
a
= 25 °C, unless otherwise noted
a
ΔV
Symbol
ΔV
R
V
GS(th)
I
t
t
t
t
I
C
V
I
DS(on)
C
V
GS(th)
D(on)
C
Q
Q
d(on)
d(off)
d(on)
d(off)
GSS
DSS
I
DS
Q
Q
g
R
SM
I
t
t
t
oss
t
t
t
t
DS
rss
SD
iss
S
rr
a
b
fs
gs
gd
r
f
r
f
g
rr
g
/T
/T
J
J
I
F
V
V
V
I
= 20 A, dI/dt = 100 A/µs, T
V
I
D
D
DS
DS
DS
DS
≅ 20 A, V
≅ 20 A, V
= 20 V, V
= 40 V, V
V
= 20 V, V
= 20 V, V
V
V
V
V
V
V
DS
V
V
V
DS
GS
DS
DS
GS
DS
GS
DD
DD
Test Conditions
= 0 V, V
= V
= 0 V, I
= 40 V, V
≥ 5 V, V
= 4.5 V, I
= 10 V, I
= 15 V, I
I
= 20 V, R
= 20 V, R
T
D
f = 1 MHz
GEN
GEN
I
C
GS
S
GS
= 1.0 mA
GS
GS
GS
= 25 °C
= 10 A
, I
= 4.5 V, R
= 4.5 V, I
= 0 V, T
= 10 V, R
D
= 10 V, I
GS
= 0 V, f = 1 MHz
D
GS
= 250 µA
D
D
GS
D
= 250 µA
L
L
= ± 20 V
= 20 A
= 15 A
= 10 V
= 15 A
= 1 Ω
= 1 Ω
= 0 V
J
D
D
= 70 °C
g
g
J
= 20 A
= 20 A
= 1 Ω
= 1 Ω
= 25 °C
Min.
1.5
2.5
40
50
0.0069
0.0084
2400
Typ.
0.81
- 5.9
260
100
6.5
4.5
5.5
44
75
37
16
30
15
45
15
40
22
14
11
11
9
5
5
S10-0109-Rev. B, 18-Jan-10
Document Number: 68647
0.0088
0.0105
± 100
Max.
100
3.0
8.5
1.2
20
56
24
45
25
70
25
15
10
60
10
40
35
25
1
mV/°C
Unit
nA
µA
pF
nC
nC
ns
ns
ns
Ω
Ω
V
V
A
S
A
V