IKW25T120 Infineon Technologies, IKW25T120 Datasheet - Page 9

IGBT 1200V 50A 190W TO247-3

IKW25T120

Manufacturer Part Number
IKW25T120
Description
IGBT 1200V 50A 190W TO247-3
Manufacturer
Infineon Technologies
Series
TrenchStop™r
Datasheets

Specifications of IKW25T120

Igbt Type
NPT, Trench and Field Stop
Voltage - Collector Emitter Breakdown (max)
1200V
Vce(on) (max) @ Vge, Ic
2.2V @ 15V, 25A
Current - Collector (ic) (max)
50A
Power - Max
190W
Input Type
Standard
Mounting Type
Through Hole
Package / Case
TO-247-3 (Straight Leads)
Transistor Type
IGBT
Dc Collector Current
50A
Collector Emitter Voltage Vces
2.2V
Power Dissipation Max
190W
Collector Emitter Voltage V(br)ceo
1.2kV
Operating Temperature Range
-40°C To +150°C
Power Dissipation Pd
190W
Rohs Compliant
Yes
Switching Frequency
TRENCHSTOP™ 2-20kHz
Package
TO-247
Vce (max)
1,200.0 V
Ic(max) @ 25°
50.0 A
Ic(max) @ 100°
25.0 A
Lead Free Status / RoHS Status
Lead free / RoHS Compliant

Available stocks

Company
Part Number
Manufacturer
Quantity
Price
Part Number:
IKW25T120
Manufacturer:
APT
Quantity:
3 000
Part Number:
IKW25T120
Manufacturer:
INFINEON/英飞凌
Quantity:
20 000
Company:
Part Number:
IKW25T120
Quantity:
9 600
Power Semiconductors
14,0mJ
12,0mJ
10,0mJ
Figure 13. Typical switching energy losses
7mJ
6mJ
5mJ
4mJ
3mJ
2mJ
1mJ
0mJ
Figure 15. Typical switching energy losses
8,0mJ
6,0mJ
4,0mJ
2,0mJ
0,0mJ
E
E
10A
E
ts
off
on
*) E
*
*
due to diode recovery
*) E
50°C
on
T
as a function of collector current
(inductive load, T
V
Dynamic test circuit in Figure E)
as a function of junction
temperature
(inductive load, V
V
Dynamic test circuit in Figure E)
due to diode recovery
J
E
E
E
I
CE
GE
and E
on
,
C
off
ts
on
,
JUNCTION TEMPERATURE
=600V, V
=0/15V, I
and E
*
*
COLLECTOR CURRENT
20A
ts
include losses
ts
include losses
C
GE
100°C
=25A, R
=0/15V, R
30A
J
CE
=150°C,
=600V,
G
=22Ω,
G
40A
=22Ω,
150°C
TrenchStop Series
9
Figure 14. Typical switching energy losses
Figure 16. Typical switching energy losses
8 mJ
6 mJ
4 mJ
2 mJ
0 mJ
10mJ
®
9mJ
8mJ
7mJ
6mJ
5mJ
4mJ
3mJ
2mJ
1mJ
0mJ
400V
E
E
V
E
ts
on
off
CE
*) E
*) E
*
*
due to diode recovery
as a function of gate resistor
(inductive load, T
V
Dynamic test circuit in Figure E)
as a function of collector emitter
voltage
(inductive load, T
V
Dynamic test circuit in Figure E)
,
due to diode recovery
on
CE
COLLECTOR
GE
on
500V
and E
=600V, V
=0/15V, I
and E
R
G
,
ts
GATE RESISTOR
ts
include losses
include losses
600V
-
C
GE
EMITTER VOLTAGE
=25A, R
IKW25T120
=0/15V, I
J
J
=150°C,
=150°C,
700V
Rev. 2.1
G
=22Ω,
C
=25A,
800V
E
E
May 06
E
on
ts
off
*
*

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